Surface Inspection Device FRT
Surface Measurement Device FRT
The measuring devices from Germany's FRT company are suitable for the analysis of all materials. With a wide variety of sensors and light sources available, it is possible to provide optimal measurements.
basic information
Measurement parameters Wafer thickness, TTV, BOW, WARP, topography, surface roughness, flatness, step height, pump diameter, structural dimensions, cavity depth, film thickness, etc.
Price range
Delivery Time
Applications/Examples of results
Target materials: - Wafers - MEMS chips, TSV holes, pumps - Automotive parts - Medical products - Packaging materials, etc.
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Distributors
Since its founding by our founder Yuuzou Torizuka in 1973, our company has continued its business activities with the motto of providing better products and services to satisfy our customers, faster and at lower costs. We aim to be a company that contributes to the global environment and the local community, and we strive to become a highly responsive company to meet all needs, with all employees working together towards this goal. We sincerely thank you for your continued support and ask for your further guidance and encouragement in the future.