Micro CT scanner
Micro CT scanner
Internal observation possible at the micron order. For electronic component development and defect analysis.
1～1 item / All 1 items
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東芝ユニファイドテクノロジーズ 東京事業所 検査システム営業部
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Micro CT scanner
Internal observation possible at the micron order. For electronic component development and defect analysis.
1～1 item / All 1 items
