Dual-type thickness gauge (electromagnetic eddy current dual-use) probe set for ferrous and non-ferrous substrates / Model number MC29WT-NEOS-MC29WTFN-325 released.
シロ産業
Electromagnetic Eddy Current Dual-purpose Film Thickness Gauge By using a dedicated probe, it automatically identifies the measurement substrate metal for easy measurement. With the compatibility of the probes, you can freely choose connection probes that fit your application and measurement target. Additionally, it is now possible to equip various probes tailored to the shape of the substrate, significantly improving work efficiency.
