Wafer Acceptance Test (WAT) Parallel Parametric Tester 'PPT8200'

Achieved over 50% higher throughput compared to conventional serial testers by adopting Per-Pin architecture!

last updated Apr 01, 2026

Silicon Photonics Wafer Test System 'SWT5100'

High-performance wafer-level test system compatible with wafers from 8 inches to 12 inches!

last updated Apr 01, 2026

High-Precision Benchtop SMU 'B2031 & B3031'

Compact and cost-effective 4-channel/8-channel desktop precision source/measurement unit!

last updated Apr 01, 2026

High-precision benchtop SMU 'B0201 & B1201'

Compact and cost-effective single/dual channel benchtop SMU!

last updated Apr 01, 2026

PCIe High-Speed Cable BERT 'B6064C'

Supports high-density testing with up to 64 lanes (128 differential pairs)!

last updated Apr 01, 2026

1.6T Bit Error Rate Tester 'B3224'

Supports PAM4/NRZ signals and covers the 1.6TBASE/CEI-224G standard!

last updated Apr 01, 2026

65 GHz Sampling Oscilloscope 'DCA6065'

Supports eye pattern testing of ultra-fast optical signals at 1.6T/800G/400G!

last updated Apr 01, 2026