CT examination system 'YXLON FF20 CT'
Industrial high-resolution X-ray CT inspection system for small components!
The "YXLON FF20 CT" is a computer tomography (CT) inspection system that achieves top-level 3D inspection through high resolution. It is suitable for inspecting small parts and fine structures required in research and development, defect analysis, process monitoring, and CT measurement in the electronics industry and materials engineering. 【Features】 ■ Equipped with a new water-cooled 190kV transmission X-ray tube, capturing fine structures down to 150nm in clear 2D images. ■ Temperature stabilization through a granite-based manipulator. ■ Intuitive and easy touch panel operation. ■ Flexible support for various applications, including helical CT scanning, expanded observation fields in the horizontal direction, virtual rotation axes, and standard features like Quick/QualityScan. ■ Precision measurement of MPE～SD～= 3.9 μm + L/75 (measured using the deviation of spherical gap distance according to VDI 2630-1.3 standard). * For more details, please refer to the PDF materials or feel free to contact us. * An English version of the catalog is available for download. * A Japanese version of the leaflet is available for download.
basic information
【Inspection Targets】 ■ Electronics components (such as SMD) ■ IC components ■ Probes made of new materials (metal, plastic, CFRP, etc.) ■ Microsystems, MEMS, MOEMS ■ Medical supplies (such as hollow needles) * For more details, please refer to the PDF document or feel free to contact us. * You can download the English version of the catalog. * You can download the Japanese version of the leaflet.
Price information
Please contact us.
Delivery Time
Model number/Brand name
Comet Yxlon
Applications/Examples of results
【Applications】 ■ Aerospace ■ Electronics ■ Automotive ■ Science and Research ■ CT Image Measurement ■ Other Applications *For more details, please refer to the PDF document or feel free to contact us. *You can download the English version of the catalog.
Detailed information
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Specifications - Sample diameter: 150 mm (5.9 inches) - Sample height: 300 mm (11.8 inches) - Maximum sample weight: 20 kg - Device dimensions and weight: W2,400 x D950 x H2,220 mm; 3,400 kg - X-ray generator: YXLON Max190kV; 80W multi-focus X-ray tube
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Non-destructive testing: Case study of X-ray CT analysis of a chip component solder joint that fractured due to reliability testing. X-ray CT analysis of the solder joint of a chip component that fractured due to reliability testing, captured with X-ray CT FF20.
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Non-destructive testing: Horizontal crack in multilayer ceramic capacitors (MLCC) - CT observation case. A case of "Horizontal crack in multilayer ceramic capacitors (MLCC) - CT observation" captured with Exlon X-ray CT FF20.
