JASIS2024 AFM-IR Device Seminar
株式会社日本レーザー
◀【Invitation to New Technology Presentation】▶ The next-generation AFM-IR technology, PiFM, offers IR spectroscopy and chemical imaging with a spatial resolution of less than 5nm and sub-monolayer sensitivity. We will present case studies in advanced materials and semiconductor research, as well as defect analysis at the tens of nanometers scale. Date and Time: September 6 (Friday) 11:00-11:30 Venue: TKP (formerly APA) Room No. 4 Title: Evaluation and IR Analysis of Semiconductor Processes and Advanced Materials at the Nanoscale Related Product: 10nm Spatial Resolution AFM-IR Device (Molecular Vista) *No prior registration is required. After registering for JASIS, please print out your admission ticket and bring it to the venue.*
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Date and time 2024年09月06日（金）
- Capital Venue: TKP (Former APA) Room No. 4
- Entry fee 無料