IC measurement substrate damage protection tool
Protects the measurement board from damage to the pad of the probe pin socket. Enables the operation of expensive measurement boards without the need for maintenance.
When probe pin sockets are applied, there may be situations where damage occurs to the terminals of the measurement board, necessitating pad repairs. Pad repairs require both cost and time, and there may be cases where spare boards need to be prepared. By applying JMT's board damage protection tool, we can eliminate damage to important measurement boards and reduce the costs and time associated with repair work. Additionally, we can propose stable contacts by applying distributed PCR at the connection points between the socket board and the measurement board. The board damage protection tool receives the connection with the probe pin through a socket board (top and bottom conductive board), and by replacing this socket board, we eliminate damage to the measurement board. *The board damage protection tool is approximately 0.3mm thick and can be used without significant characteristic loss. For detailed specifications, we will conduct individual designs for each project, so please feel free to contact our company representative.
basic information
- Compatible pitch: 1.27 to 0.25 millimeters * The compatible electrode length and magnetic pole diameter vary for each pitch. - Compatible grid count: 100 x 100 (approx.) * The compatible grid count varies depending on the pitch. - Compatible size: 100 x 100 millimeters (electrode area/approx.) * The compatible size varies depending on the pitch. - Operating temperature range: Standard type / -40 to 125℃, Wide range type / -55 to 150℃
Price range
Delivery Time
Applications/Examples of results
- Final selection test (handler) - System level test / SLT - High-frequency verification evaluation - Design verification evaluation - Reliability evaluation - Debug verification - Inter-board connection (short-distance connection connector, solder replacement) / BtoB - Burn-in test
