[Proposal Example 1 for Semiconductor Manufacturing Equipment] ExpEther Solution
Since they can be separated into different enclosures, the constraints regarding component selection (such as enclosure size and bus) are easier to relax!
We would like to introduce a proposal for a wafer inspection device using a high-resolution camera. Since it can be separated into different enclosures, the constraints related to component selection (such as enclosure size and bus) are easier to alleviate, making repairs and updates for each part more manageable. Additionally, it is flexible and easy to change the configuration when differentiating performance for each model of the final product. *For more details, please refer to the PDF document or feel free to contact us.
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