Xenon Continuous Light Source Atomic Absorption Analysis Device contrAA 800 Series
A single lamp can measure all elements! An innovative atomic absorption analysis device that visually confirms the effects of proximity lines.
This is a new atomic absorption analysis device that overturns the conventional concept of atomic absorption analysis equipment, developed for the first time in the world by Analytik Jena using the xenon continuous light source background correction method. It covers all wavelength ranges used in atomic absorption analysis with a single light source, and in frame measurements, it allows for a reduction in measurement time through sequential measurements. The high-resolution optical system enables visual confirmation and separation of nearby lines. The high-precision background correction function, unaffected by nearby line interference, has significantly improved the accuracy of measurement results. 【Features】 ■ Equipped with a high-resolution echelle spectrometer (0.002nm/200nm) ■ Multi-element sequential rapid measurement with xenon continuous light source/CCD detection ■ Expansion of the measurement concentration linear range through multi-wavelength measurement of the same element and dynamic mode ■ Enhanced analytical capabilities by utilizing not only atomic absorption lines but also molecular absorption lines ■ Detailed data analysis through 2D and 3D data display ■ Direct analysis of solid samples is possible (optional: solid sampler) ■ High reliability of data and excellent automation efficiency with an auto-sampler ■ Analytik Jena offers a unique 10-year warranty on the optical system.
basic information
■Lamp: Xenon lamp ■Wavelength range: 185~900 nm ■Background correction: Xenon continuous light source correction ■Detector: Semiconductor detector (CCD)
Price information
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Model number/Brand name
contrAA 800 series
Applications/Examples of results
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Line up（3）
| Model number | overview |
|---|---|
| contrAA 800 F | Dedicated to frame use. It also supports hydride generation methods. |
| contrAA 800 G | Dedicated to furnace use. It is also possible to connect a solid sampler to directly measure solid samples. |
| contrAA 800 D | Dual-purpose for frame and furnace. The frame and furnace automatically switch for a space-saving design. With additional options, hydride generation methods and direct furnace measurement of solid samples are also possible. |
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News about this product（2）
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We will exhibit at JASIS 2025!
We will be exhibiting at the JASIS exhibition held at Makuhari Messe from September 3 (Wednesday) to September 5 (Friday) this year as well. Please be sure to stop by our booth. The booth number is 6B-505. We will be announcing new products for ICP-OES. Exhibited equipment: - Atomic absorption spectrometer - ICP emission spectrometer - Microwave sample decomposition device - TOC analyzer Exhibitor Seminars (New Technology Presentation) ■ September 3 (Wednesday) 12:00–12:30 Venue: Makuhari Messe Conference Hall, Room 101 Surpassing the limits of atomic absorption analysis! Achieving efficient measurements like ICP-OES with easy operation using a xenon continuous light source atomic absorption spectrometer. ■ September 4 (Thursday) 15:00–15:30 Venue: TKP (formerly APA) Venue, Room No. 7 How far can we go? High-sensitivity analysis using a high-resolution ICP emission spectrometer equipped with an Echelle double monochromator and CCD detector. ■ September 4 (Thursday) 15:00–15:30 Venue: TKP (formerly APA) Venue, Room No. 7 Fully compliant with petrochemical JIS standards! A multifunctional nitrogen, sulfur, and chlorine analysis device that condenses solutions for routine analysis and research and development challenges into one unit.
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We will exhibit at JASIS 2025, held from September 3 to 5, 2025!
We will be exhibiting at the JASIS exhibition held at Makuhari Messe International Exhibition Hall this year as well. [Exhibited Products] ■ High-resolution ICP optical emission spectrometer ■ Continuous light source atomic absorption spectrometer ■ TOC analyzer ■ Microwave sample digestion system [Exhibitor Seminars (New Technology Presentations)] ■ September 3 (Wed) 12:00–12:30 [Atomic Absorption] Venue: Makuhari Messe Conference Hall, Room 101 Surpassing the limits of atomic absorption analysis! A xenon continuous light source atomic absorption spectrometer that achieves efficient measurements like ICP-OES with easy operation. ■ September 4 (Thu) 15:00–15:30 [ICP-OES] Venue: TKP (formerly APA) Venue, Room No. 7 How far can we go? High-sensitivity analysis using a high-resolution ICP optical emission spectrometer equipped with an Echelle double monochromator and CCD detector. ■ September 5 (Fri) 15:00–15:30 [Trace Nitrogen, Sulfur, Chlorine] Venue: TKP (formerly APA) Venue, Room No. 1 Fully compliant with petrochemical JIS standards! A multifunctional nitrogen, sulfur, and chlorine analyzer that condenses solutions for routine analysis and research and development challenges into one device.
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Analytik Jena is a leading provider of analytical measuring technology, instruments in the field of molecular biology, and liquid handling and lab automation technologies. The company is present for its customers in many industries, as well as over 100 countries. Analytik Jena’s analysis instruments are used whenever precision and reliability are required. Whether it is water analysis, environmental monitoring, health care, or quality control, the company’s devices guarantee that strict standards have been maintained. Services, as well as device-specific consumables and disposables, such as plastic articles, complete the extensive range of products.