Introduction to the product lineup of the heating warp measurement device by Akrometrix.
We introduce a lineup of various substrate warpage measurement devices manufactured by Akrometrix! There are a total of four types.
◆TherMoiré PS200S 【Features】 - Lower heating specification - Measurement field 200mm×200mm - Warpage data acquisition time approximately 2 seconds - Option to equip with DIC2.0 ◆TherMoiré PS600S 【Features】 - Compatible with large substrates - Measurement field 600mm×600mm - Warpage data acquisition time approximately 2 seconds - Option to equip with DFP2, DIC2.0 ◆Table Top Shadow Moiré 【Features】 - Tabletop type room temperature inspection device - Measurement field 300mm×300mm - Warpage data acquisition time approximately 2 seconds ◆Table Top DFP 【Features】 - Inspection device for mounted products at room temperature - Measurement field 192mm×240mm - Warpage data acquisition time approximately 1 second ● For more details, please contact us or download the catalog.
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Starting with printed circuit boards, we provide cutting-edge technology to electronic component manufacturers in Japan through the sale of manufacturing equipment for major electronic components such as semiconductors, LCDs, and PDPs, as well as inspection and analysis equipment. Although we operate as a trading company, we leverage our many years of experience in resist coating as a "trading company that can speak about technology" to offer optimal solutions to various customers, and we will continue to contribute to the Japanese electronic component industry.