Heating warp measurement device
Heating warp measurement device
It is a heated warp measurement device.
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Shadow Moiré Type Substrate Warpage Measurement Device TherMoiré AXP3
Measuring the warping of the substrate during heating using shadow moiré measurement! ◆Warping data obtained in about 2 seconds per point! ◆Achieving a resolution of 0.5 microns!
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TherMoiré Shadow Moiré Type Curvature Measurement Device Various Options
You can select a measurement method that suits your measurement application (sample). Measurements can be taken under various conditions such as implemented products, strain, and when cooled!
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Introduction to the product lineup of the heating warp measurement device by Akrometrix.
We introduce a lineup of various substrate warpage measurement devices manufactured by Akrometrix! There are a total of four types.
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