Wide field of view, high resolution, space-saving! High pixel camera from CIS.
A simple system configuration with one camera achieves a wide field of view and high-resolution imaging of 120 million pixels!
For customers who are facing the issues of 'when inspecting with one camera, the field of view is too small and cannot capture everything...' and 'in the case of parallel inspections using multiple cameras, there is not enough space...', CIS proposes the high-resolution camera series 'VCC-120CXP1', which achieves wide field of view and high resolution with a simple system configuration using just one camera, rather than parallel inspections with multiple cameras. This contributes to solving the challenges of customers in various industries and fields who are seeking wide field of view, high resolution, and space/cost efficiency.
basic information
■Wide-angle shooting is possible When combining the camera "VCC-120CXP1M" (effective pixel count 13264×9180, unit cell size 2.2 μm) with a variable magnification lens (0.007-0.15x)… Example usage) Magnification = 0.15, WD = 450mm Field of View (FOV): 195mm×135mm (pixel resolution 15 μm) can be achieved! ■High-resolution shooting is possible When combining the camera "VCC-120CXP1M" (effective pixel count 13264×9180, unit cell size 2.2 μm) with a 1x lens… Example usage) Magnification = 1, WD = 132.1mm Field of View (FOV): 29.2mm×20.2mm (pixel resolution approximately 2.2 μm) can be achieved! *The magnification and WD mentioned above are theoretical values. ■Space-saving shooting: From multiple units to one The visible area when imaging with a 120M camera is equivalent to about 5 units of a 25M camera! Additionally, the reduced equipment requirements contribute to space-saving and cost-saving. *For more details, please refer to the downloadable material "Introduction to the Ultra High Resolution VCC-120CXP with 120 Million Pixels [Proposal Example Edition]" below.
Price range
Delivery Time
Model number/Brand name
VCC-120CXP1M (Monochrome) / VCC-120CXP1R (Color)
Applications/Examples of results
Appearance inspection of LCDs, substrates, semiconductor wafers, buildings, etc. (defects/abnormalities/shapes), line inspection, measurement, position determination, picking of tiny components, drone mounting, research and observation, etc.
