SXGA CoaXPress SWIR camera
CXP I/F detects wavelengths from 400 to 1700 nm and can capture visible + SWIR images!
A new CoaXPress camera has arrived, capable of inspecting previously invisible workpieces with a detection wavelength range of 400nm to 1700nm! It can capture both visible and SWIR images with a single camera. **Benefits of Inspection in the SWIR Band** - Subjects that appear the same color under visible light can show different colors in the SWIR band due to varying moisture permeability, allowing for differentiation of materials and contents. - Depending on the type of liquid, light can be absorbed or transmitted, making it possible to determine the presence and quantity of contents as well as the presence of foreign substances. - Leaf veins and bruises on fruits become more pronounced, making it effective for freshness checks and quality inspections. Leveraging these features, the camera is expected to be utilized in various applications such as wafer inspection, electronic circuit board inspection, food inspection, agricultural product inspection, pharmaceutical and tablet inspection, identification classification, and process quality control. *For more details, please refer to the PDF document or contact our sales department.*
basic information
Model Name: VCC-SXCXP1SW Sensor: SONY SenSWIR IMX990 (SWIR) Sensor Size: 1/2 inch Unit Cell Size: 5×5 μm Effective Pixel Count: 1296×1032 Resolution: SXGA Frame Rate: 134.73fps (8bit), 125.2fps (10bit), 71.52fps (12bit) Lens Mount: C-mount Dimensions: 65×65×65mm Product Status: Accepting Orders Other Features: BNC connector, external trigger, ROI, illumination trigger control, detection wavelength range 400-1700nm, cost reduction achieved *For more details, please refer to the PDF document or contact our sales department.*
Price range
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Model number/Brand name
VCC-SXCXP1SW
Applications/Examples of results
Wafer inspection, electronic circuit board inspection, food inspection, agricultural product inspection, pharmaceutical and tablet inspection, identification and classification, process quality control, etc.
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