Semiconductor Characterization System
Support from package level to wafer level.
High-precision voltage and current application, as well as the electrical characteristics and continuous changes of individual FET transistors, can be measured, allowing for centralized management of data collection and monitoring on a single PC.
basic information
■AMM-C (Package Level) - Temperature Control: Constant temperature chamber (Espec small environmental test chamber SU-662) temperature control range: -60 to +150°C - Connection to DUT: DUT board (6 sockets) DIP600mil 28pin, DIP300mil 16pin selectable ■AMM-W (Wafer Level) - Temperature Control: Full/semi-auto/manual prober (please consult for manufacturer) - Connection to DUT: Positioner probe card (for high temperature and low current) *Suggestions will be made based on layout ≪Common Specifications≫ - Measurement Program: FET single transistor measurement library, 48 types - SMU Performance: Voltage ±50V / Current ±100mA
Price range
Delivery Time
Model number/Brand name
AMM-2000
Applications/Examples of results
We will provide further information separately.
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