LV124 Part II One-Stop Solution

We will undertake all necessary tests from the 28 items of LV124 Part II in a single package.

last updated Mar 09, 2026

Commissioned Testing and Calibration Certificate

We leverage our years of experience and achievements to provide comprehensive support for our customers' reliability testing.

last updated Mar 09, 2026

Spot Cooling and Heating Device for Rapid Cooling and Heating with Constant Temperature Air

Added a new "tip heater type" with a temperature change rate of 100°C/min to streamline the temperature characteristic evaluation of semiconductors and electronic devices.

last updated Mar 09, 2026

Conductor Resistance Evaluation System

Continuously measure the micro-resistance values of solder joints and connector connections. Efficiently evaluate the reliability of the connection parts.

last updated Mar 09, 2026

Semiconductor Characterization System

Support from package level to wafer level.

last updated May 25, 2026

Capacitor Temperature Characteristic Evaluation System (Dielectric Property Evaluation)

Automatic recording of capacitor parameters for temperature and frequency characteristics.

last updated May 25, 2026

[Information] Lineup of semiconductor-related testing equipment

Heat management is essential for improving semiconductor performance, ensuring reliability, and extending lifespan!

last updated Jun 12, 2026