Bilateral Microscope System "TOMOS-50"
Introducing the front and back misalignment / dimensional measurement microscope. Achieved high precision at a low cost.
The "TOMOS-50" is a compact type of measurement system that can simultaneously capture the front and back of electronic components such as crystal oscillators, MEMS, and semiconductors, and measure with an accuracy of ±0.2μm or less. The front and back optical axis correction can be precisely adjusted using a micro stage and software. Additionally, it is also available for sale as a dual-sided microscope module for device integration. Please contact us for more information. 【Features】 ■ Compact type ■ Approximately 3 million pixels ■ Simultaneous capture of both sides, dimensional measurement, and position deviation measurement ■ High-precision correction of the front and back optical axis using a micro stage and software ■ Measurement of position deviation between front and back with a repeatability of ±0.2μm or less (varies depending on conditions) *For more details, please refer to the PDF document or feel free to contact us.
basic information
【Specifications (Partial)】 ■Optical System ・Body Tube: 2 (Inverted, Upright) ・Objective Lenses: 2 (Selectable from 5x, 10x, 20x, 50x) ・Z Coarse and Fine Adjustment: Manual (Inverted, Upright) ■Measurement Section ・Measurement Reproducibility: ±0.2μm or less (varies depending on measurement conditions) ・PC OS: Windows 10 ・Display Monitor: Dual Screen Display ■Software ・Front and Back Optical Axis Correction Function ・Simultaneous Front and Back Imaging, Image Filing ・Front and Back Dimension Measurement ・Front and Back Position Displacement Measurement, etc. *For more details, please refer to the PDF document or feel free to contact us.
Price range
Delivery Time
Applications/Examples of results
【Applications】 ■Observation: Simultaneous observation of the front and back of electronic paper, electrophoresis, particles, fluids, filters, etc. ■Front and back positional displacement measurement: Measurement of positional displacement of inkjet nozzles, quartz oscillators, MEMS, etc. ■Front and back dimensional measurement: Dimensional measurement of quartz oscillators, semiconductor linewidth patterns, etc. *For more details, please refer to the PDF document or feel free to contact us.
