Dual-sided microscope system with wide-field ring lighting 'TOMOS-50R1'
Dual-sided wide-angle shooting is possible with a 1x shooting field of view! (Field of view 9mm x 7mm)
The "TOMOS-50R1" is a dual-sided microscope system equipped with wide-field ring lighting that allows for dual-sided wide-field imaging at a 1x magnification. It can simultaneously capture images of both sides of electronic components such as crystal oscillators, MEMS, and holes in printed circuit boards. Additionally, it can measure the misalignment of patterns and alignment marks on both sides with a repeatability accuracy of ±0.010mm. 【Features】 ■ High-precision image processing correction for optical axis misalignment of the microscope, lens magnification errors, and camera θ misalignment. ■ Dimension measurement is possible without the hassle of flipping the sample over. ■ Simultaneous imaging of both sides of crystal oscillators, MEMS, holes in printed circuit boards, and electronic components. *For more details, please download the PDF or feel free to contact us.
basic information
【Software Features】 ■ Front and rear optical axis correction ■ Front and rear lens magnification correction ■ Camera mount θ correction ■ Simultaneous front and rear shooting, filing ■ Front and rear image composite display ■ Manual measurement/automatic measurement of front and rear dimensions (optional) ■ Manual measurement/automatic measurement of front and rear positional deviation (optional) *For more details, please download the PDF or feel free to contact us.
Price range
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Model number/Brand name
Dual-sided microscope system with wide-field ring lighting 'TOMOS-50R1'
Applications/Examples of results
【Applications (Excerpt)】 ■Simultaneous Observation of Front and Back - Inspection of surface defects on electronic components such as capacitors and resistors, as well as lenses and connectors. ■Measurement of Front and Back Misalignment - Inspection of misalignment on printed circuit boards, printed materials' alignment marks, and LED chips. *For more details, please download the PDF or feel free to contact us.
