Dual-sided microscope system
Dual-sided microscope system
We would like to introduce our "Dual-Sided Microscope System."
1～12 item / All 12 items
-
For inspecting the front and back position misalignment of printed circuit boards! Dual-sided microscope system with lighting.
Achieving high-efficiency inspection through simultaneous observation of both sides. A microscope system that reliably captures scratches and misalignments on fine components such as lenses, LED chips, and communication parts!
last updated
-
For inspecting front and back scratches on lenses and connectors! Illuminated dual-sided microscope system.
Achieving high-efficiency inspection through simultaneous observation of both sides. A microscope system that reliably captures scratches and misalignments on fine components such as lenses, LED chips, and communication parts!
last updated
-
For inspecting surface defects on electronic components such as capacitors and resistors! Dual-sided microscope system.
A low-magnification wide-field microscope that can simultaneously observe both sides of electronic components and printed circuit boards. Ideal for scratch inspection and measuring misalignment of alignment marks!
last updated
-
Dual-sided microscope system with wide-field ring lighting 'TOMOS-50R1'
Dual-sided wide-angle shooting is possible with a 1x shooting field of view! (Field of view 9mm x 7mm)
last updated
-
6-inch electric XY stage dual-side microscope system
Equipped with an electric XY stage and autofocus function!
last updated
-
8-inch electric XY stage dual-sided microscope system
We measure the positional deviation of the front and back with a repeatability accuracy of ±0.3μm or less!
last updated
-
High-Sensitivity Camera Set for Microscopes 'FR-400'
Comes with dedicated measurement software! Can be retrofitted regardless of the microscope manufacturer.
last updated
-
Bilateral Microscope System "TOMOS-80XY"
Equipped with an 8-inch electric XY stage and autofocus function! Precisely controls movement to prevent measurement errors.
last updated
-
Bilateral Microscope System "TOMOS-60XY"
Equipped with XY electric stage and autofocus function! Customization for software and more is also supported.
last updated
-
Bilateral Microscope System "TOMOS-50"
Introducing the front and back misalignment / dimensional measurement microscope. Achieved high precision at a low cost.
last updated
-
Bilateral Microscope System "TOMOS Series"
Correcting the optical axis shift of the microscope's front and back, variations in the objective lens magnification, and the camera's θ shift with images!
last updated
-
Dual-Sided Microscope System for Semiconductors 'TOMOS-50'
Supports foreign matter inspection in semiconductor manufacturing. Achieves high-precision measurement.
last updated
