For inspecting the front and back position misalignment of printed circuit boards! Dual-sided microscope system with lighting.

Achieving high-efficiency inspection through simultaneous observation of both sides. A microscope system that reliably captures scratches and misalignments on fine components such as lenses, LED chips, and communication parts!

最終更新日 Jul 17, 2025

For inspecting front and back scratches on lenses and connectors! Illuminated dual-sided microscope system.

Achieving high-efficiency inspection through simultaneous observation of both sides. A microscope system that reliably captures scratches and misalignments on fine components such as lenses, LED chips, and communication parts!

最終更新日 Jul 17, 2025

For inspecting surface defects on electronic components such as capacitors and resistors! Dual-sided microscope system.

A low-magnification wide-field microscope that can simultaneously observe both sides of electronic components and printed circuit boards. Ideal for scratch inspection and measuring misalignment of alignment marks!

最終更新日 Jul 17, 2025

Dual-sided microscope system with wide-field ring lighting 'TOMOS-50R1'

Dual-sided wide-angle shooting is possible with a 1x shooting field of view! (Field of view 9mm x 7mm)

最終更新日 Jul 16, 2025

6-inch electric XY stage dual-side microscope system

Equipped with an electric XY stage and autofocus function!

最終更新日 Jul 18, 2025

8-inch electric XY stage dual-sided microscope system

We measure the positional deviation of the front and back with a repeatability accuracy of ±0.3μm or less!

最終更新日 Jul 18, 2025

High-Sensitivity Camera Set for Microscopes 'FR-400'

Comes with dedicated measurement software! Can be retrofitted regardless of the microscope manufacturer.

最終更新日 Jul 18, 2025

Bilateral Microscope System "TOMOS-80XY"

Equipped with an 8-inch electric XY stage and autofocus function! Precisely controls movement to prevent measurement errors.

最終更新日 Jan 17, 2025

Bilateral Microscope System "TOMOS-60XY"

Equipped with XY electric stage and autofocus function! Customization for software and more is also supported.

最終更新日 Jan 06, 2025

Bilateral Microscope System "TOMOS-50"

Introducing the front and back misalignment / dimensional measurement microscope. Achieved high precision at a low cost.

最終更新日 Dec 06, 2024

Bilateral Microscope System "TOMOS Series"

Correcting the optical axis shift of the microscope's front and back, variations in the objective lens magnification, and the camera's θ shift with images!

最終更新日 Aug 29, 2025