For inspecting surface defects on electronic components such as capacitors and resistors! Dual-sided microscope system.
A low-magnification wide-field microscope that can simultaneously observe both sides of electronic components and printed circuit boards. Ideal for scratch inspection and measuring misalignment of alignment marks!
The "TOMOS-50R1" is a dual-sided microscope system equipped with wide-field ring lighting, capable of capturing images with a 1x field of view. It allows for the inspection of both sides of electronic components such as condensers and resistors, resin parts for communication devices, and entire pieces like lenses. 【Features】 ■ High-precision image processing correction for optical axis misalignment of the microscope, lens magnification errors, and camera θ misalignment ■ Dimension measurement is possible without the hassle of flipping the sample over ■ Simultaneous imaging of both sides of quartz oscillators, MEMS, holes in printed circuit boards, and electronic components ■ Measurement of misalignment in patterns and alignment marks on both sides with a repeatability accuracy of ±0.010mm (※) ※ Measurement accuracy may vary depending on subject conditions, measurement conditions, objective lens magnification, measurement environment, etc. Please confirm with sample tests. ＼ For more details, please check "Download Catalog" ／
basic information
For more details, please download the catalog or feel free to contact us.
Price range
Delivery Time
Model number/Brand name
Dual-sided microscope system with wide-field ring lighting 'TOMOS-50R1'
Applications/Examples of results
【Applications】 ■Simultaneous observation of both sides ・Inspection of surface defects on electronic components such as capacitors and resistors, as well as lenses and connectors. ■Measurement of misalignment between both sides ・Inspection of misalignment on printed circuit boards, alignment marks on printed materials, and LED chips. *For more details, please download the catalog or feel free to contact us.
