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X-ray observation device "IX-1610"
X-ray observation device for analysis with a high resolution of 0.25 μm focal spot size.
last updated
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3D stereo inline X-ray inspection device ILX1000/2000
Inspection is possible only on the surface of the double-sided implementation substrate! Also compatible with 3D tomography inspection. *Detailed explanatory materials will be provided.
last updated