X-ray wafer bump automatic inspection system 'Six-3000'

Transmitting X-rays to the voids inside the wafer! Automatically inspecting the quality of voids above the reference value.

last updated Sep 29, 2023

Silicon wafer crystal defect void inspection device 'X-CAS-2'

Automatically inspect crystal defect voids inside silicon wafers!

last updated Jul 10, 2025

X-ray wafer bump automatic inspection system 'Six-3000'

Automated X-ray inspection device for inspecting solder bumps on wafers.

last updated Jul 10, 2025

X-ray observation device "IX-1610"

X-ray observation device for analysis with a high resolution of 0.25 μm focal spot size.

last updated Jul 10, 2025

3D stereo inline X-ray inspection device ILX1000/2000

Inspection is possible only on the surface of the double-sided implementation substrate! Also compatible with 3D tomography inspection. *Detailed explanatory materials will be provided.

last updated Jul 10, 2025