This campaign has ended. Thank you very much for your many applications. As a token of our appreciation for your long-standing support, we are currently running a campaign where 100 lucky winners will receive wonderful gifts through a lottery. We look forward to receiving many applications. 【Campaign Application Period】 May 1, 2024 (Wednesday) to November 20, 2024 (Wednesday) *Applications received on the day will be accepted.

We will be showcasing Kubota's powder supply and real-time monitoring system. Please come and see the latest Kubota products that contribute to the promotion of DX in the powder supply process at the venue. 【Exhibition Information】 'POWTEX 2024 25th International Powder Industry Exhibition Tokyo' Dates: November 27 (Wednesday) - November 29 (Friday), 2024, 9:30 AM - 5:00 PM Venue: Tokyo Big Sight, East Halls 1, 2, and 3 Kubota Booth: 1P-19 【Exhibited Products】 - Remote Monitoring System CraftPat - Feeder Control System WF Series - Weight Feeder NX Series - Pulse Jet Backwash Filter JetFilter, among others.

Kubota's "weighing business" celebrated its 100th anniversary in 2024. We cherish the connections built over many years and express our gratitude, while also viewing this as an opportunity to leverage the technology we have cultivated and pursue further leaps into the next era. By "measuring correctly," Kubota has continued to contribute to the development of society. We will continue to create new value in "measuring" and support a prosperous future for people. 《A special site for the 100th anniversary of the weighing business is now live!》 We are sharing special content and great campaign information, so please take a look.

The strand monitoring/anomaly detection device has newly launched as an option for the CraftPat compound line monitoring system! It monitors the strands formed by the extruder using a thermal camera, detecting temperature anomalies, cuts, and fusions in real-time. By providing alarm outputs, it minimizes line troubles. Additionally, by linking with the "CraftPat Compound Line Comprehensive Monitoring System," it enables centralized management of strand anomaly history, temperature data, as well as operational data from feeders, extruders, and pelletizers. This can be utilized for analyzing the frequency of anomalies and trends based on product grades, materials, and operating methods. 【Features】 ■ Labor Reduction Eliminates the need for line patrols for strand management and temperature measurement, improving work efficiency. ■ Reduction of Defective Products Enables early detection of strand anomalies, contributing to reduced downtime and defective products on the production line. ■ Quality Improvement Centralized management of data through integration with the compound line remote management system allows for anomaly trend analysis and quality improvement.

Detection of fine surface defects such as scratches and pits on the hard disk surface By irradiating the surface of the hard disk with a high-power laser, fine surface defects such as scratches and pits are detected, classified by defect type, and the results are displayed. The simultaneous irradiation of multiple lasers not only detects scratches with high sensitivity but also determines the uneven shapes of the defects. Features: - Detection of minute defects using high-power lasers - High scratch detection capability - Discrimination of defect unevenness - Automatic focusing for all units - Excellent cost performance - Customization support - Automatic inspection for one cassette - Compatible with transparent glass substrates

Transparent wafers can also be inspected at high speed! High-output lasers detect tiny scratches and particles! The 'Laser Explorer' is the latest wafer surface defect inspection device that supports transparent wafers. High-output lasers detect minute defects such as scratches, pits, and particles! It can be utilized for shipping and receiving inspections of wafers, as well as quality control in the epitaxial process! 【Other Features】 ■ High throughput (inspects 25 wafers in a cassette in about 40 minutes) ■ Discriminates the unevenness of defects ■ Automatic focus for all samples ■ Customization available ■ Automatic inspection for one cassette ■ High-precision marking for defects (optional) ■ Defect review using a laser microscope (optional)