The strand monitoring/anomaly detection device has newly launched as an option for the CraftPat compound line monitoring system! It monitors the strands formed by the extruder using a thermal camera, detecting temperature anomalies, cuts, and fusions in real-time. By providing alarm outputs, it minimizes line troubles. Additionally, by linking with the "CraftPat Compound Line Comprehensive Monitoring System," it enables centralized management of strand anomaly history, temperature data, as well as operational data from feeders, extruders, and pelletizers. This can be utilized for analyzing the frequency of anomalies and trends based on product grades, materials, and operating methods. 【Features】 ■ Labor Reduction Eliminates the need for line patrols for strand management and temperature measurement, improving work efficiency. ■ Reduction of Defective Products Enables early detection of strand anomalies, contributing to reduced downtime and defective products on the production line. ■ Quality Improvement Centralized management of data through integration with the compound line remote management system allows for anomaly trend analysis and quality improvement.

Detection of fine surface defects such as scratches and pits on the hard disk surface By irradiating the surface of the hard disk with a high-power laser, fine surface defects such as scratches and pits are detected, classified by defect type, and the results are displayed. The simultaneous irradiation of multiple lasers not only detects scratches with high sensitivity but also determines the uneven shapes of the defects. Features: - Detection of minute defects using high-power lasers - High scratch detection capability - Discrimination of defect unevenness - Automatic focusing for all units - Excellent cost performance - Customization support - Automatic inspection for one cassette - Compatible with transparent glass substrates

Transparent wafers can also be inspected at high speed! High-output lasers detect tiny scratches and particles! The 'Laser Explorer' is the latest wafer surface defect inspection device that supports transparent wafers. High-output lasers detect minute defects such as scratches, pits, and particles! It can be utilized for shipping and receiving inspections of wafers, as well as quality control in the epitaxial process! 【Other Features】 ■ High throughput (inspects 25 wafers in a cassette in about 40 minutes) ■ Discriminates the unevenness of defects ■ Automatic focus for all samples ■ Customization available ■ Automatic inspection for one cassette ■ High-precision marking for defects (optional) ■ Defect review using a laser microscope (optional)