[Ion Chromatography Data] Measurement of Impurities in Ammonium Hydroxide
Automating the concentration process involving neutralization and matrix removal in ion chromatography to measure impurities in high-purity ammonium hydroxide used in semiconductor manufacturing.
In the semiconductor industry, ultra-high purity reagents are required. The presence of ionic impurities can compromise the quality of the products. This application presents the measurement results of anionic impurities in a 28% semiconductor-grade ammonium hydroxide solution. To avoid the influence of the matrix, measurements were conducted using concentration techniques involving inline neutralization and matrix removal.
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