一般財団法人材料科学技術振興財団　MST Official site

Technical Information "Evaluation of Ion Implantation Damage in GaN using XAFS (C0472)" has been published.

一般財団法人材料科学技術振興財団　MST

We have published the following analysis case on the MST website: - Evaluation of ion implantation damage in GaN using XAFS (C0472) For more details, please visit the MST website. http://www.mst.or.jp/