[Analysis Case] PL Mapping of Multicrystalline Silicon Solar Cells

It is possible to non-destructively identify the location of defects in solar cell cells.

最終更新日 Mar 13, 2025

[Analysis Case] Evaluation of the Diffusion Layer in Crystalline Si Solar Cells

Quantitative evaluation of dopants and evaluation of carrier distribution.

最終更新日 Mar 13, 2025

[Analysis Case] Impurity Evaluation of Crystalline Si Solar Cells

Trace analysis of metallic elements and atmospheric component elements.

最終更新日 Mar 13, 2025

[Analysis Case] Evaluation of Carrier Distribution in Crystalline Si Solar Cells

Evaluation of carrier diffusion layer uniformity in samples with surface roughness.

最終更新日 Mar 13, 2025

[Analysis Case] Evaluation of Dopant Concentration Distribution in a-Si Thin Film Solar Cells Using SIMS

Select measurement conditions according to the target element.

最終更新日 Mar 13, 2025

[Analysis Case] Quantification of Interstitial Atom Concentration in Silicon Single Crystals

Quantitative analysis of interstitial oxygen and carbon concentration non-destructively using infrared absorption method.

最終更新日 Mar 13, 2025

Analysis case: Composition distribution analysis of CIGS thin films

It is possible to evaluate the composition quantification, in-plane distribution, and depth distribution of thin films.

最終更新日 Mar 13, 2025

[Analysis Case] Composition and Impurity Analysis of CIGS Powder

Quantitative analysis of main components and trace components is possible.

最終更新日 Mar 13, 2025

[Analysis Case] Atomic Level Structural Analysis of CIGS Thin-Film Solar Cells

Atomic-level resolution EDX analysis using Cs-corrected STEM.

最終更新日 Mar 13, 2025

[Analysis Case] Evaluation of Metal Films by High-Temperature XRD

Tracking evaluation of phase transitions and crystallinity changes during the heating process.

最終更新日 Mar 13, 2025

[Analysis Case] Band Gap Evaluation of Oxidized and Nitrided Thin Films

High-precision band gap evaluation is possible through combined analysis of XAFS and XPS.

最終更新日 Mar 13, 2025

[Analysis Case] Evaluation of Interstitial Carbon in Si Substrate Using Low-Temperature PL and SIMS Analysis

It is possible to confirm the trace amounts of carbon contained in the Si substrate.

最終更新日 Mar 13, 2025

Regarding interface and depth direction resolution

SIMS: Secondary Ion Mass Spectrometry

最終更新日 Mar 12, 2025

Evaluation methods for organic compounds in clean rooms

GC/MS: Gas Chromatography-Mass Spectrometry

最終更新日 Mar 12, 2025

[Analysis Case] Stress Evaluation by Raman Mapping

It is possible to confirm the stress distribution in the sample cross-section.

最終更新日 Mar 13, 2025

[Analysis Case] De-gassing Analysis of Graphene Powder by TDS

It is possible to evaluate the outgassing caused by functional groups and impurities in carbon materials.

最終更新日 Mar 13, 2025

[Analysis Case] STEM/EDX and Image Simulation for Crystal Structure Evaluation

The evaluation of the crystal structure can be performed based on the STEM images and the results of atomic composition measurements.

最終更新日 Mar 13, 2025

[Analysis Case] Analysis of the HTM Layer in Perovskite Solar Cells

Evaluation of component and depth direction distribution is possible.

最終更新日 Mar 13, 2025

Qualitative Analysis of Organic Materials Used in Perovskite Solar Cells

We will conduct qualitative evaluation of organic materials, focusing on hall transport materials, using LC/MS.

最終更新日 Mar 13, 2025

List of reliability tests

Reliability Test

最終更新日 Mar 12, 2025

Evaluation avoiding duplication of Oji Peak by HAXPES.

Comparison of spectra obtained from Ga line (HAXPES) and Al line/Mg line (XPS) measurements.

最終更新日 Mar 12, 2025

[Analysis Case] STEM, EBSD Image Simulation for Polycrystalline Structure Analysis

Evaluation of crystal forms using simulations.

最終更新日 Mar 13, 2025

[Analysis Case] Emission Analysis of Perovskite Solar Cells

It is possible to evaluate the luminescent properties and degradation analysis of perovskite solar cells non-destructively.

最終更新日 Apr 17, 2025