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Supercritical fluid chromatography-mass spectrometry method
Supercritical fluid chromatography is a method that uses supercritical CO2 as the mobile phase to separate components contained in a sample and detect them with a mass detector.
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Support for the utilization of point cloud data
We will conduct customized analysis based on structural understanding for diverse point cloud data.
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Notice of Website Renewal
To a more user-friendly and easier-to-read homepage.
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Cryo-SEM analysis: Evaluation of the dispersion state of microparticles in liquid.
By rapid freezing and SEM observation, the dispersion of particles was confirmed through images! ★Data displayed at the 25th Interphex Japan★
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[Analysis Case] Depth Direction Analysis of Organic EL Material TOF-SIMS RGB Elements
Evaluation of organic EL layer structures and degradation layers using GCIB (Ar cluster) under atmospheric control.
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New TOF-SIMS analysis service launched, ideal for organic EL analysis.
It has become possible to analyze in depth without damaging organic components! The spatial resolution has also improved compared to conventional methods, allowing for evaluation in narrow areas.
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[Analysis Case] IGZO
Case studies of XRD and XRR analysis of oxide semiconductors.
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Strong support for research and development: "Contract Analysis Services"
We will conduct contract analysis of materials and products entrusted to us by our customers. We will handle everything from pre-treatment to measurement and provide analysis data.
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Ion Chromatography Method
Ion chromatography is a method for detecting ionic components in liquid samples.
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[GDMS] Glow Discharge Mass Spectrometry
Dissociate and fragment specific mass ions, and detect them with a mass spectrometer.
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X-ray Absorption Fine Structure (XAFS)
XAFS is a method for analyzing the absorption spectrum obtained by irradiating a substance with X-rays.
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[Slice&View] Three-Dimensional SEM Observation Method
By repeatedly performing cross-sectioning processing with FIB and observation with SEM, and reconstructing the obtained images, three-dimensional structural information can be obtained.
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[TEM-EDX] Energy Dispersive X-ray Spectroscopy (TEM)
EDX is a method that measures the energy and occurrence of characteristic X-rays generated when an electron beam is irradiated onto the analysis area, allowing for elemental analysis and compositional analysis.
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[ED] Electron Diffraction Method
ED is a method for investigating crystal structures from diffraction patterns obtained by irradiating a sample with an electron beam.
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[SMM] Scanning Microwave Microscopy Method
Scanning Microwave Microscopy
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[SRA] Spread Resistance Measurement Method
SRA:Spreading Resistance Analysis
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[OBIRCH] Light Beam Heating Resistance Variation Method
OBIRCH is a method that utilizes the change in resistance caused by the heat generated at defect locations when light is applied, to identify abnormal areas.
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Lock-in thermal analysis method
The lock-in thermal analysis method detects slight temperature increases in the current path.
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Differential Scanning Calorimetry (DSC)
DSC can evaluate the physical properties of a sample based on the heat changes that occur during heating.
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[XRF] X-ray fluorescence analysis method
This is a method for conducting elemental analysis and compositional analysis by detecting fluorescent X-rays generated by irradiating with X-rays and spectrally analyzing them using energy or a spectroscopic crystal.
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[RBS] Rutherford Backscattering Spectrometry
It is a method for measuring the energy and intensity of ions scattered backward by Rutherford scattering after irradiating a solid sample with an ion beam.
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Total Organic Carbon Measurement
The TOC analyzer is a device that can evaluate the total carbon content, total organic carbon content, and inorganic carbon content (IC) in a sample.
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Ar ion milling processing
This is a processing method for producing thin film samples for transmission electron microscopy with a thickness of less than 50 nm by performing mechanical polishing followed by finishing with a low-energy Ar ion beam.
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Ultramicrotome processing
This is a processing method for cutting bulk samples using a diamond knife to produce ultra-thin sections for transmission electron microscopy with a thickness of less than 100 nm.
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[Analysis Case] Analysis of Organic Foreign Substances on Printed Circuit Boards
Reduce the impact of foreign matter surrounding information through appropriate sampling and microscopic measurement.
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[Analysis Case] Condition Assessment of Highly Degraded Organic Materials
It is possible to accurately evaluate materials through sampling under controlled atmospheric conditions.
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[Analysis Case] Observation of the Cross-Section of Tooth Enamel Prisms
Applying FIB processing technology, the entire interface of enamel/dental adhesive is observed.
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[Analysis Case] Evaluation of the Structure and Dispersion of Microparticles in Liquid
Observation of cross-sectional structure of liquid samples using cryo-SEM.
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[Analysis Case] PL Mapping of Multicrystalline Silicon Solar Cells
It is possible to non-destructively identify the location of defects in solar cell cells.
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[Analysis Case] Evaluation of the Diffusion Layer in Crystalline Si Solar Cells
Quantitative evaluation of dopants and evaluation of carrier distribution.
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