OBF STEM method (Optimal Bright Field Scanning Transmission Electron Microscopy)
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OBF STEM: Optimum Bright-Field STEM Method
The OBF STEM method is a technique that reconstructs a single STEM image by applying a weighted frequency filter to multiple STEM images obtained from each segment of a segmented STEM detector, appropriately emphasizing different spatial frequency components for each segment. It is characterized by its ability to efficiently utilize the detection signal, allowing for the visualization of structures with low noise and high contrast even under conditions of low electron beam exposure.
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Applications/Examples of results
Analysis of LSI memory, optical devices, secondary batteries, and polymer materials.
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MST is a foundation that provides contract analysis services. We possess various analytical instruments such as TEM, SIMS, and XRD to meet your analysis needs. Our knowledgeable sales representatives will propose appropriate analysis plans. We are also available for consultations at your company, of course. We have obtained ISO 9001 and ISO 27001 certifications. Please feel free to consult us for product development, identifying causes of defects, and patent investigations! MST will guide you to solutions for your "troubles"!