[Analysis Case] Evaluation of Crystal Grains and Resistance in CIGS Thin-Film Solar Cells

Resistance distribution and evaluation of crystal grains and grain boundaries at the same location.

last updated Mar 13, 2025

[Analysis Case] Observation of the Buffer Layer Interface in CIGS Thin-Film Solar Cells

Crystal structure evaluation of the Zn(S, O, OH)/CIGS junction interface using ultra-high resolution STEM.

last updated Mar 13, 2025

[Analysis Case] Evaluation of the state of the organic thin film solar cell electrode interface and the dispersion state of the organic film.

It is possible to conduct a comprehensive evaluation analysis that minimizes the influence of the atmosphere.

last updated Mar 13, 2025

[Analysis Case] Cross-sectional Observation of TEM/SEM Organic EL and Gate Oxide Film

Low-acceleration STEM observation allows for contrast even in low-density membranes.

last updated Mar 13, 2025

[Analysis Case] Composite Evaluation of Zn-based Buffer Layer Using X-rays

Evaluation of composition, bonding state, structure, and density is possible.

last updated Mar 13, 2025

[Analysis Case] Evaluation of Surface Deterioration of Polycarbonate

Structural analysis of resin surface degradation using TOF-SIMS.

last updated Mar 13, 2025

[Analysis Case] TMAH Analysis Case in Si-containing Solution by IC Method

The measurement of amines is possible using the IC (Ion Chromatography) method.

last updated Mar 13, 2025

[Analysis Case] Evaluation of the Degradation Layer of Polycarbonate

It is possible to evaluate the film thickness of the degraded layer using the GCIB (Ar cluster).

last updated Mar 13, 2025

Precautions for Low-Temperature Photoluminescence Measurement

Photoluminescence method

last updated Mar 12, 2025

[Analysis Case] Evaluation of Work Function After Thin Film Surface Treatment

UPS analysis after surface plasma treatment of ITO.

last updated Mar 13, 2025

Valence evaluation of metal oxides by chemical shift

XPS: X-ray Photoelectron Spectroscopy

last updated Mar 12, 2025

Evaluation of the orientation angle of organic film materials

XAFS: X-ray Absorption Fine Structure

last updated Mar 12, 2025

Types and Characteristics of Electron Diffraction

TEM: Transmission Electron Microscopy

last updated Mar 12, 2025

[Analysis Case] Low-Temperature PL Spectrum of Si After Ion Implantation Annealing Treatment

It is possible to confirm the recovery of crystallinity due to irradiation defects and annealing.

last updated Mar 13, 2025

[Analysis Case] Evaluation of Silicon Oxide Film by XAFS

Local structural analysis around silicon, quantification of intermediate oxides, evaluation of bulk and interfaces.

last updated Mar 13, 2025

[Analysis Case] Evaluation of Specific Crystalline Grains in CIGS Thin-Film Solar Cells

Observation of orthogonal cross-sections at locations with characteristics identified in EBIC measurements of arbitrary cross-sections.

last updated Mar 13, 2025

[Analysis Case] Evaluation of the Mixed State of the Active Layer in Organic Thin-Film Solar Cells

Evaluation of the distribution state of organic materials using low-energy STEM observation and EELS measurement.

last updated Mar 13, 2025

[Analysis Case] Observation of Heterojunction Interface in CIGS Thin-Film Solar Cells

Evaluation of the crystal structure of the high-resistance layer at the CdS/CIGS junction interface using ultra-high-resolution STEM.

last updated Mar 13, 2025

[Analysis Case] Resistance Evaluation of Heterojunction Interface in CIGS Solar Cells

Evaluation of local resistance distribution using scanning spreading resistance microscopy (SSRM) under vacuum.

last updated Mar 13, 2025

[Analysis Case] Evaluation of Composition Distribution in the Active Layer of Organic Thin-Film Solar Cells

Preprocessing and depth direction analysis are possible under controlled atmosphere conditions.

last updated Mar 13, 2025

[Analysis Case] Observation of Pigment and Dye Dispersion

Micron-order imaging measurement using TOF-SIMS.

last updated Mar 13, 2025

[Analysis Case] Evaluation of the BSF Layer in Si-based Solar Cells

Impurity evaluation with in-plane distribution is possible using cross-sectional imaging SIMS.

last updated Mar 13, 2025

[Analysis Case] Evaluation of pn Junction and Grain Structure of CIGS Film

Electron beam induced current method and crystal orientation analysis using SEM.

last updated Mar 13, 2025

[Analysis Case] Evaluation of Interdiffusion Between Layers of CIGS Solar Cells Using SIMS

It is possible to achieve high-precision measurements that are not affected by surface irregularities.

last updated Mar 13, 2025

[Analysis Case] Evaluation of Crystal Grains in CIGS Film

Crystal orientation analysis using SEM.

last updated Mar 13, 2025

[Analysis Case] Cross-Section Observation of Organic Thin-Film Solar Cells

Using low acceleration voltage STEM, slight density differences in organic films can be observed.

last updated Mar 13, 2025

[Analysis Case] Evaluation of Composition and Impurity Distribution of ZnO Films by SIMS

Visualization of in-plane distribution through imaging SIMS analysis.

last updated Mar 13, 2025

[Analysis Case] Component Analysis of Organic EL Devices

TOF-SIMS component analysis of slope-polished organic multilayer structure samples.

last updated Mar 13, 2025

Distortion evaluation using SEM equipment

EBSD: Electron Backscatter Diffraction

last updated Mar 12, 2025

Micro-sampling method

FIB: Focused Ion Beam Processing

last updated Mar 12, 2025