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[Analysis Case] Component Analysis of Organic EL Devices

C0020.jpg
C0020.jpg

[Analysis Case] Component Analysis of Organic EL Devices

TOF-SIMS component analysis of slope-polished organic multilayer structure samples.

We conducted TOF-SIMS analysis on an organic EL device (Figure 1) estimated to be formed from four layers of different organic compounds (or organometallic complexes) using XPS. For multilayer structural samples, depth profiling analysis using sputtering is also performed; however, in this case, we created a slope surface to expose each layer without breaking the bonds of the constituent components. Molecular weight-related ions and fragment ions presumed to be Alq3, NPD, and CuPc were obtained, confirming that TOF-SIMS analysis of the slope surface is an effective method for component analysis of organic multilayer films.

Related Link - https://www.mst.or.jp/casestudy/tabid/1318/pdid/32…

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Analysis of solar cells and lighting.

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[Analysis Case] Component Analysis of Organic EL Device_C0020

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