[Analysis Case] Identification and Estimation of Foreign Substances and Contaminants in LCD Panels

We capture foreign substances and dirt from microns to centimeter order as an image.

last updated Mar 13, 2025

Pre-treatment and measurement under high purity atmosphere.

XPS: X-ray photoelectron spectroscopy, etc.

last updated Mar 12, 2025

[Analysis Case] Evaluation of "Water" in Si Oxide Films and ITO Films using SIMS

Depth-direction analysis of hydrogen using 'heavy water (D2O) treatment'

last updated Mar 13, 2025

[Analysis Case] Composite Analysis of White Powder

Identification of powders by FT-IR analysis and XRF analysis.

last updated Mar 13, 2025

[Analysis Case] Depth Direction Analysis of Degradation Components in GCIB_Ar Cluster Organic Materials

Component evaluation of organic EL layer structures and degradation layers using GCIB under controlled atmosphere.

last updated Mar 13, 2025

[Analysis Case] SIMS Analysis of Compound Layered Structure Samples

Analysis is possible after selectively removing the compound layer through preprocessing.

last updated Mar 13, 2025

[Analysis Case] Measurement of Film Density and Film Thickness of Organic EL Device Stacked Films

X-ray reflectivity measurement (XRR) allows for non-destructive analysis of film thickness and density.

last updated Mar 13, 2025

[Analysis Case] Condition Assessment of Highly Degraded Organic Materials

It is possible to accurately evaluate materials through sampling under controlled atmospheric conditions.

last updated Mar 13, 2025

[Analysis Case] Evaluation of the State of the Electrode/Organic Layer Interface in Organic EL Devices

The process will be carried out from pretreatment to XPS measurement under an inert gas atmosphere.

last updated Mar 13, 2025

[Analysis Case] Evaluation of the Interface between the Alq3 Layer and the Emission Layer of Organic EL Devices

Degradation assessment by depth profiling using TOF-SIMS.

last updated Mar 13, 2025

[Analysis Case] Observation of Pigment and Dye Dispersion

Micron-order imaging measurement using TOF-SIMS.

last updated Mar 13, 2025

[Analysis Case] Depth Profile Analysis of Impurities in Organic EL Devices Using SIMS

Evaluate organic EL elements with good depth direction resolution.

last updated Mar 13, 2025

[Analysis Case] Evaluation of Layer Structure of Organic EL Devices

By performing preprocessing under controlled atmosphere conditions, it is possible to analyze while preventing oxidative degradation.

last updated Mar 13, 2025

[Analysis Case] Evaluation of Layer Structure of Organic EL Devices

Preventing oxidation degradation during cutting processing under N2 atmosphere.

last updated Mar 13, 2025

[Analysis Case] Component Analysis of Organic EL Emission Layer

Possible to dismantle and preprocess while maintaining the atmosphere, up to the introduction of equipment.

last updated Mar 13, 2025

[Analysis Case] Evaluation of Organic EL Device Degradation

Suppressing changes due to processing through cutting under atmosphere control.

last updated Mar 13, 2025

[Analysis Case] Depth Direction Analysis of TFT Wiring Intersection Using SSDP-SIMS

Analysis using SSDP is also possible for microdomains and glass substrates.

last updated Mar 13, 2025

[Analysis Case] Comprehensive Evaluation of Organic EL Displays

We evaluate by combining various methods such as structural understanding, material assessment, and identification of deterioration causes.

last updated Mar 13, 2025

[Analysis Case] Cross-sectional Observation of TEM/SEM Organic EL and Gate Oxide Film

Low-acceleration STEM observation allows for contrast even in low-density membranes.

last updated Mar 13, 2025

Micro-sampling method

FIB: Focused Ion Beam Processing

last updated Mar 12, 2025

[Analysis Case] IGZO

Case studies of XRD and XRR analysis of oxide semiconductors.

last updated Mar 13, 2025

Analysis of evolved gases and identification of polymer materials using GC/MS.

Principles and Applications of Pyrolysis GC/MS

last updated Mar 12, 2025

[Analysis Case] Qualitative Analysis of Organic EL Layer

Suppression of component alteration through measurement surface finishing under atmosphere control.

last updated Mar 13, 2025

[Analysis Case] Depth Direction Analysis of Polyimide Components

Evaluation of the depth direction of surface modification layers of polymers, resins, and films using TOF-SIMS is possible.

last updated Mar 13, 2025

[Analysis Case] Evaluation of Element Distribution in Textured GaN-based LEDs

Even with a structure that has uneven surfaces, depth distribution evaluation is possible through flattening processing.

last updated Mar 13, 2025

[Analysis Case] Depth Profile Concentration Analysis of Impurities in GaN-based LEDs Using SIMS

Measurements will be taken under analysis conditions suited to the purpose.

last updated Mar 13, 2025

[Analysis Case] Analysis of Smartphone Sealants by Pyrolysis GC/MS

Analysis of UV-curable materials is possible through two-stage heating.

last updated Mar 13, 2025

[Analysis Case] Foreign Substance Analysis Using Micro-Sampling Tools

Identifies the components of foreign substances without the influence of the substrate or base material.

last updated Mar 13, 2025

[Analysis Case] Evaluation of Copper (Cu) Oxide Film Thickness: Differences Due to Storage Environment

It is possible to capture molecular information of inorganic substances in the depth direction using TOF-SIMS.

last updated Mar 13, 2025

[Analysis Case] Evaluation of Layer Structure and Film Thickness of Naturally Oxidized Copper (Cu) Surface Film

Depth-direction state evaluation using TOF-SIMS.

last updated Mar 13, 2025