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[Analysis Case] Measurement of Film Density and Film Thickness of Organic EL Device Stacked Films

C0067.jpg

[Analysis Case] Measurement of Film Density and Film Thickness of Organic EL Device Stacked Films

C0067.jpg
C0067.jpg

X-ray reflectivity measurement (XRR) allows for non-destructive analysis of film thickness and density.

Organic EL displays are advancing in practical applications by leveraging advantages such as high brightness, high-resolution color, and thinness due to their self-emissive principle. Organic EL devices are manufactured by stacking organic films, but analyzing the organic films in their stacked state has been challenging. This time, by using the XRR method, it has become possible to measure the film thickness and density of the organic films while maintaining the stacked state. Analysis of the thickness and density of stacked films is possible regardless of whether they are crystalline or amorphous.

Related Link - https://www.mst.or.jp/casestudy/tabid/1318/pdid/32…

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Analysis of lighting and display.

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[Analysis Case] Measurement of Film Density and Film Thickness of Organic EL Element Stacked Film_C0067

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