Measurement Method: X-ray Diffraction Related

Measurement Method: X-ray Diffraction Related
◆XRD (X-ray Diffraction) ◆XRR (X-ray Reflectivity) ◆SAXS (Small-Angle X-ray Scattering)
1~22 item / All 22 items
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X-ray Reflectivity Method
XRR:X-ray Reflectivity
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X-ray diffraction method
XRD is a method for obtaining information about the crystal structure of a sample from its diffraction pattern.
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[SAXS] Small-Angle X-ray Scattering Method
- Capable of evaluating periodic structures and orientation at the nanoscale.
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Rietveld analysis refers to
Detailed information such as atomic arrangements within the crystal can be obtained from the analysis of measurement data like XRD.
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[Analysis Case] Evaluation of Antibacterial Coating by XPS
Various surface treatments can be verified.
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Hard X-ray Photoelectron Spectroscopy
HAXPES is an analytical method that uses hard X-rays as the excitation light for XPS (X-ray photoelectron spectroscopy).
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Contract analysis service for in situ measurement using X-ray CT.
It is possible to observe three-dimensional structures under heating/cooling and stress/compression load conditions.
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[Analysis Case] Measurement of Partial Density of States of GaN
Information about valence bands and gap states can be obtained by element.
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[Analysis Case] CFRP (Carbon Fiber Reinforced Plastic) Internal Fiber Orientation Analysis
Case study of CFRP analysis using X-ray CT.
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[Analysis Case] Structural Refinement of Powdered Crystalline Materials Using Rietveld Analysis Method
It is possible to refine the crystal structure from powder X-ray diffraction data.
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[Analysis Case] Evaluation of the Imidization Reaction of Polyimide
The degree of imidization due to differences in heating conditions can be evaluated using XPS.
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[Analysis Case] Evaluation of Glass Fiber Reinforced Plastic using X-ray CT and GC/MS
Evaluation of GFRP is possible according to the purpose.
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[Analysis Case] Composition Analysis of the Surface Film on the Positive Electrode of Secondary Batteries
Evaluation of the distribution of organic components and active substances on the surface, qualitative analysis.
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[Analysis Case] Rietveld Analysis of Secondary Battery Cathode Materials
Quantitative analysis of positive electrode active materials, precise evaluation of crystal structure.
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[Analysis Case] Analysis of All-Solid-State Batteries
Comprehensive analytical evaluation combining structure, composition, and electrical properties.
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[Analysis Case] Binding State Mapping by XPS
It is possible to evaluate the distribution of surface contamination and surface treatment on samples with mm-order precision.
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[Analysis Case] Structural Analysis of Non-Woven Fabric Masks
Comparison of structures before and after mask use using X-ray CT.
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[Analysis Case] Wide-area Quantitative Mapping using XPS
It is possible to evaluate the composition distribution in an area of up to 70×70mm.
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[Analysis Case] XPS Analysis of Metal Pipe Inner Wall Using Combined Cutting Processing
We provide one-stop solutions from sample cutting processing to investigating the causes of discoloration and corrosion.
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[Analysis Case] Evaluation of Sn Surface State by XPS
It is possible to calculate the ratio by valence (divalent, tetravalent).
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[Analysis Case] Structural Evaluation of Secondary Battery Separators
Evaluation of the shape and composition of organic/inorganic multilayer structures.
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[Analysis Case] Comprehensive Evaluation of Positive Electrode Active Materials in Secondary Batteries
Proposing an evaluation that combines structure, composition, and electricity to solve development issues.
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