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[Analysis Case] Evaluation of Sn Surface State by XPS

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[Analysis Case] Evaluation of Sn Surface State by XPS

It is possible to calculate the ratio by valence (divalent, tetravalent).

Tin (Sn), such as in solder, is used in many electronic components. In the XPS analysis of the Sn surface, by using the 4d orbitals in addition to the quantitative and state analysis typically performed with the 3d orbitals, it is possible to separate the oxidation states (divalent Sn2+ (SnO) and tetravalent Sn4+ (SnO2)) and calculate their ratios. Furthermore, by examining the valence band, it is possible to sensitively detect even a very small amount of the low oxidation state (divalent Sn2+ (SnO)). This document presents examples of evaluating Sn on the surface of solder using various orbitals.

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Measurement method: XPS Product field: Oxide semiconductors, electronic components Analysis purpose: Evaluation of chemical bonding state and electronic state

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Analysis of oxide semiconductors and electronic components.

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[Analysis Case] Evaluation of Sn Surface State by XPS_C0603

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