[Analysis Case] Comprehensive Evaluation of Lighting Emitting Devices

We will conduct analysis of various materials, including the disassembly of LEDs, phosphors, and LED chips.

last updated Mar 13, 2025

[Analysis Case] Measurement of Film Density and Film Thickness of Organic EL Device Stacked Films

X-ray reflectivity measurement (XRR) allows for non-destructive analysis of film thickness and density.

last updated Mar 13, 2025

[Analysis Case] Condition Assessment of Highly Degraded Organic Materials

It is possible to accurately evaluate materials through sampling under controlled atmospheric conditions.

last updated Mar 13, 2025

[Analysis Case] Component Analysis of Organic EL Devices

TOF-SIMS component analysis of slope-polished organic multilayer structure samples.

last updated Mar 13, 2025

[Analysis Case] Evaluation of Impurity Concentration in AlGaN UV Sensors Using SIMS

A lineup of AlGaN standard samples with various Al compositions.

last updated Mar 13, 2025

[Analysis Case] Depth Direction Analysis of Degradation Components in GCIB_Ar Cluster Organic Materials

Component evaluation of organic EL layer structures and degradation layers using GCIB under controlled atmosphere.

last updated Mar 13, 2025

[Analysis Case] SIMS Analysis of Compound Layered Structure Samples

Analysis is possible after selectively removing the compound layer through preprocessing.

last updated Mar 13, 2025

[Analysis Case] Composition Analysis of GaN-based LED Structures using SIMS

Capable of evaluating the composition of the main elemental components of GaN-based LEDs in the depth direction.

last updated Mar 13, 2025

Micro-sampling method

FIB: Focused Ion Beam Processing

last updated Mar 12, 2025

[Analysis Case] Depth Direction Analysis of Organic EL Material TOF-SIMS RGB Elements

Evaluation of organic EL layer structures and degradation layers using GCIB (Ar cluster) under atmospheric control.

last updated Mar 13, 2025

[Analysis Case] Visualization of Strain at Heterojunction Interfaces in Compounds

Lattice image analysis using the FFTM method

last updated Mar 13, 2025

[Analysis Case] Comprehensive Evaluation of Organic EL Displays

We evaluate by combining various methods such as structural understanding, material assessment, and identification of deterioration causes.

last updated Mar 13, 2025

[Analysis Case] Cross-sectional Observation of TEM/SEM Organic EL and Gate Oxide Film

Low-acceleration STEM observation allows for contrast even in low-density membranes.

last updated Mar 13, 2025

Analysis of evolved gases and identification of polymer materials using GC/MS.

Principles and Applications of Pyrolysis GC/MS

last updated Mar 12, 2025

[Analysis Case] Depth Direction Analysis of Polyimide Components

Evaluation of the depth direction of surface modification layers of polymers, resins, and films using TOF-SIMS is possible.

last updated Mar 13, 2025

[Analysis Case] Photoluminescence Analysis of White LEDs

Verification of the luminous characteristics of the chip and phosphor in white LEDs.

last updated Mar 13, 2025

[Analysis Case] SIMS Measurement of Specially Shaped Samples

Analysis is possible even for special shapes through innovative fixing methods.

last updated Mar 13, 2025

[Analysis Case] Diffusion Evaluation of Ga and Al in Si Substrate using SSDP-SIMS

Measurement avoiding the influence of high concentration layers using SSDP-SIMS.

last updated Mar 13, 2025

[Analysis Case] Evaluation of Element Distribution in Textured GaN-based LEDs

Even with a structure that has uneven surfaces, depth distribution evaluation is possible through flattening processing.

last updated Mar 13, 2025

[Analysis Case] Depth Profile Concentration Analysis of Impurities in GaN-based LEDs Using SIMS

Measurements will be taken under analysis conditions suited to the purpose.

last updated Mar 13, 2025

[Analysis Case] Quality Evaluation of SiC Substrates

Evaluation of crystal orientation, in-plane defect distribution, surface roughness, and impurities.

last updated Mar 13, 2025

[Analysis Case] SSDP-SIMS Analysis of Mg in GaN-based LED Structure

It is possible to obtain the impurity profile in the GaN-based LED structure from the backside.

last updated Mar 13, 2025

[Analysis Case] Composition Analysis of Compound Semiconductors by SIMS

Capable of evaluating the composition of the main elemental components of compound semiconductors in the depth direction.

last updated Mar 13, 2025

Interference peak removal process in quantitative analysis

X-ray photoelectron spectroscopy (XPS)

last updated Mar 12, 2025

[Analysis Case] Foreign Substance Analysis Using Micro-Sampling Tools

Identifies the components of foreign substances without the influence of the substrate or base material.

last updated Mar 13, 2025

Precautions for Low-Temperature Photoluminescence Measurement

Photoluminescence method

last updated Mar 12, 2025

[Analysis Case] Evaluation of Composition and Bonding State of GaN Film by XPS

Evaluation will be conducted under measurement conditions tailored to the purpose.

last updated Mar 13, 2025

Valence evaluation of metal oxides by chemical shift

XPS: X-ray Photoelectron Spectroscopy

last updated Mar 12, 2025

Evaluation of the orientation angle of organic film materials

XAFS: X-ray Absorption Fine Structure

last updated Mar 12, 2025

Types and Characteristics of Electron Diffraction

TEM: Transmission Electron Microscopy

last updated Mar 12, 2025