[Analysis Case] Depth Direction Analysis of Organic EL Material TOF-SIMS RGB Elements
Evaluation of organic EL layer structures and degradation layers using GCIB (Ar cluster) under atmospheric control.
Organic EL displays are materials that hold the potential for high resolution and low power consumption, and market expansion is expected. In recent years, there has been a trend towards miniaturizing pixel arrangements to achieve higher image quality. When measuring small pixels, conventional oblique cutting TOF-SIMS measurements made it difficult to evaluate in the depth direction. However, by introducing GCIB (Ar cluster), it has become possible to evaluate organic EL materials in the depth direction with good reproducibility, even for small pixels, and to assess material degradation and diffusion as well. *GCIB: Gas Cluster Ion Beam
basic information
For detailed data, please refer to the catalog.
Price information
-
Delivery Time
Applications/Examples of results
Analysis of lighting and display.