[Analysis Case] Manufacturing Equipment and Components
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[Analysis Case] Manufacturing Equipment and Components
We will introduce examples of analysis for manufacturing equipment and components.
1~30 item / All 88 items
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[Analysis Case] Investigation of the Causes of Surface Stains and Water Repellency on Parts Using TOF-SIMS
Properly sampling and measuring surface contamination even on large parts that cannot be cut.
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[Analysis Case] Evaluation of the Depth Direction State of Stainless Steel Passive Film
Waveform analysis and evaluation of the depth distribution of bonding states by Ar sputtering.
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[Analysis Case] Evaluation of SUS Passive Film Depth Direction State and Oxide Film Thickness
It is possible to capture molecular information of inorganic substances in the depth direction using TOF-SIMS.
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[Analysis Case] Analysis of Evolved Gases during High-Temperature Heating in Air by Pyrolysis GC/MS
It is possible to track the thermal decomposition behavior in the presence of oxygen.
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[Analysis Case] Composite Analysis of White Powder
Identification of powders by FT-IR analysis and XRF analysis.
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[Analysis Case] Identification of Fluorine-based Lubricants and Polymers using TOF-SIMS
Identify the contaminating components and estimate the contamination occurrence process.
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[Analysis Case] Investigation of Causes of Peeling in Plating and Coating
Identification of contamination sources on the cleavage surface using TOF-SIMS.
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[Analysis Case] Component Identification of Foreign Substances Considering Thermal History
Proposal for the use of standard samples with aligned thermal history.
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[Analysis Case] Evaluation of Impurities in Metal Wires
Visualizing the in-plane distribution of impurities such as atmospheric components with a field equivalent to SEM.
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[Analysis Case] Evaluation of Si Natural Oxidation Film Thickness
Estimation of film thickness using the average free path of photoelectrons.
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[Analysis Case] SIMS Measurement of Specially Shaped Samples
Analysis is possible even for special shapes through innovative fixing methods.
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[Analysis Case] Analysis of the Multilayer Structure of Polymer Films
Clear visualization of the layer structure of multilayer films using low-damage sputtering with GCIB.
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Interference peak removal process in quantitative analysis
X-ray photoelectron spectroscopy (XPS)
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Analysis of anion concentration in liquid
IC: Ion Chromatography
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[Analysis Case] Qualitative Analysis of Acrylic Resin
It is possible to estimate components using TOF-SIMS analysis.
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[Analysis Case] TMAH Analysis Case in Si-containing Solution by IC Method
The measurement of amines is possible using the IC (Ion Chromatography) method.
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[Analysis Case] Foreign Substance Analysis Using Micro-Sampling Tools
Identifies the components of foreign substances without the influence of the substrate or base material.
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[Analysis Case] Depth Direction Analysis of Thin Carbon Films
Depth-direction analysis of diamond-like carbon (DLC) and graphene is possible.
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[Analysis Case] High-Precision Quantification of the sp2/(sp2+sp3) Ratio of DLC Films
High-precision analysis using XAFS
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[Analysis Case] Evaluation of the sp2/(sp2+sp3) Ratio of DLC Films
Evaluation of the sp2/(sp2+sp3) ratio using C1s waveform analysis.
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[Analysis Case] Removal of Organic Contaminants by Etching
We will remove surface contamination and conduct an evaluation using XPS.
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Valence evaluation of metal oxides by chemical shift
XPS: X-ray Photoelectron Spectroscopy
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Types and Characteristics of Electron Diffraction
TEM: Transmission Electron Microscopy
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Detection of trace components by P&T of volatile organic compounds (VOCs)
GC/MS: Gas Chromatography-Mass Spectrometry
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[Analysis Case] Evaluation of Additives in Polymer Materials
Qualitative analysis of components by LC/MS.
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[Analysis Case] Evaluation of Additives in Polymer Materials Using Dissolution-Reprecipitation Method
Qualitative analysis of components using LC/MS and LC/MS/MS.
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[Analysis Case] Qualitative Analysis of Powder Contaminants
By combining techniques, it is possible to obtain multiple types of component information.
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Pre-treatment methods for trace element analysis on the wafer surface.
ICP-MS: Inductively Coupled Plasma Mass Spectrometry
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Concentration analysis of volatile components using a sample concentration needle.
GC/MS: Gas Chromatography-Mass Spectrometry
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[Analysis Case] Evaluation of the Condition of Foreign Matter with Surface Oxidation Film
Evaluation of aluminum hydroxide Al(OH)3 and aluminum oxide Al2O3 is possible.
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