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[Analysis Case] Evaluation of the Depth Direction State of Stainless Steel Passive Film

C0003.jpg

[Analysis Case] Evaluation of the Depth Direction State of Stainless Steel Passive Film

C0003.jpg
C0003.jpg

Waveform analysis and evaluation of the depth distribution of bonding states by Ar sputtering.

XPS allows for the evaluation of bonding states of oxidized components (components bonded with oxygen) and metallic components (components bonded with metals). Additionally, by using argon ion sputtering, it is also possible to evaluate bonding states in the depth direction. * Regarding the passive film on the surface of stainless steel (with a thickness of several tens of nm to several hundred nm), the results of the above measurements showed that (1) there are many Fe oxidized components on the surface side, (2) Cr oxidized components exist below the Fe oxide layer, and (3) Ni oxidized components are almost nonexistent. * Since it includes changes in bonding states due to sputtering, the evaluation is primarily based on relative comparisons.

Related Link - https://www.mst.or.jp/casestudy/tabid/1318/pdid/17…

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[Analysis Case] Evaluation of the Depth Direction State of Stainless Steel Passive Film_C0003

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