[AES] Auger Electron Spectroscopy

By measuring the kinetic energy distribution of Auger electrons emitted by electron beam irradiation, insights can be gained regarding the types and quantities of elements present on the sample surface.

last updated Mar 12, 2025

Scanning Electron Microscopy (SEM)

High magnification observation (up to about 300,000 times) is possible.

last updated Mar 12, 2025

[EBIC] Electron Beam Induced Current

A method to obtain information about the electric field structure inside the sample (junction structure of semiconductors).

last updated Mar 12, 2025

[EBSD] Electron Backscatter Diffraction Method

It is possible to easily obtain crystal information over a wide area.

last updated Mar 12, 2025

[SEM-EDX] Energy Dispersive X-ray Spectroscopy (SEM)

It is a method for conducting elemental analysis and compositional analysis by detecting characteristic X-rays generated by electron beam irradiation and spectrally analyzing them by energy.

last updated Mar 12, 2025

[Slice&View] Three-Dimensional SEM Observation Method

By repeatedly performing cross-sectioning processing with FIB and observation with SEM, and reconstructing the obtained images, three-dimensional structural information can be obtained.

last updated Mar 12, 2025

(S)TEM (Scanning Transmission Electron Microscopy)

Elemental analysis, state evaluation, particle size analysis, and acquisition of three-dimensional structural images at the nanoscale.

last updated Mar 12, 2025

[TEM-EELS] Electron Energy Loss Spectroscopy

By measuring the energy lost due to interactions with atoms as electrons pass through thin film samples, the constituent elements and electronic structure of the material can be analyzed.

last updated Mar 12, 2025

[ED] Electron Diffraction Method

ED is a method for investigating crystal structures from diffraction patterns obtained by irradiating a sample with an electron beam.

last updated Mar 12, 2025

[SIM] Scanning Ion Microscopy Method

Observation of SIM images is possible with high resolution (accelerating voltage 30kV: 4nm).

last updated Mar 12, 2025

[TEM-EDX] Energy Dispersive X-ray Spectroscopy (TEM)

EDX is a method that measures the energy and occurrence of characteristic X-rays generated when an electron beam is irradiated onto the analysis area, allowing for elemental analysis and compositional analysis.

last updated Mar 12, 2025

[Analysis Case] Degradation Analysis of Liquid Crystal Displays

We will comprehensively evaluate liquid crystals, alignment films, sealing materials, TFTs, and more.

last updated Mar 13, 2025

[Analysis Case] Cell Cycle Assessment from Bacterial Images

By using deep learning and data analysis, we can evaluate sample characteristics by utilizing large amounts of data.

last updated Mar 13, 2025

[TEM ED-Map] TEM Electron Diffraction Mapping Method

This is a method for analyzing the orientation distribution of crystalline samples using electron diffraction in a transmission electron microscope (TEM).

last updated Mar 12, 2025

[Analysis Case] Evaluation of Two-Dimensional Electron Gas Layer in Normally Off GaN HEMT

We can offer a one-stop solution for comprehensive analysis of product research.

last updated Mar 13, 2025

[Analysis Case] Trench-type Si-MOSFET IDSS Leakage Location Analysis

One-stop service from identifying device defects to analyzing causes.

last updated Mar 13, 2025

[Analysis Case] Failure Analysis of SiC Transistor using Slice & View

Check the leak path by 3D visualization of SEM images.

last updated Mar 13, 2025

[Analysis Case] Component Analysis of Leakage Areas in SiC Power Transistors

It is possible to perform magnified observation and EDX analysis at the gate destruction location identified by Slice & View.

last updated Mar 13, 2025

[EPMA] Electron Probe Micro Analyzer

By analyzing the characteristic X-rays generated when a finely focused electron beam is irradiated onto the surface of a solid sample in a vacuum, insights can be gained regarding the identification of elements and quantitative values.

last updated Mar 12, 2025

Identification of resistance anomalies due to absorption current

You can identify high resistance and open areas in the wiring from the absorption current image.

last updated Mar 12, 2025

Structural analysis using Xe-plasma FIB.

Precision processing/structural evaluation is possible over a wide area of several hundred micrometers.

last updated Mar 12, 2025

[Analysis Case] Lithium-ion Secondary Battery

Accurate evaluation of the separator cross-sectional shape through sample cooling.

last updated Mar 13, 2025

[Analysis Case] STEM, EBSD Image Simulation for Polycrystalline Structure Analysis

Evaluation of crystal forms using simulations.

last updated Mar 13, 2025

[Analysis Case] Analysis of All-Solid-State Batteries

Comprehensive analytical evaluation combining structure, composition, and electrical properties.

last updated Mar 13, 2025

[Analysis Case] Structural Evaluation of Secondary Battery Separators

Evaluation of the shape and composition of organic/inorganic multilayer structures.

last updated Mar 13, 2025

[Analysis Case] Evaluation of Resistance Values and Li Distribution in Secondary Battery Cathodes

Distribution of resistance values in the electrode cross-section, visualization of conduction paths, and comparison with ion distribution.

last updated Mar 13, 2025

[Analysis Case] Comprehensive Evaluation of Positive Electrode Active Materials in Secondary Batteries

Proposing an evaluation that combines structure, composition, and electricity to solve development issues.

last updated Mar 13, 2025