[Analysis Case] STEM, EBSD Image Simulation for Polycrystalline Structure Analysis
Evaluation of crystal forms using simulations.
High-resolution HAADF-STEM images reflect the atomic arrangement of crystals, and by simulating STEM images corresponding to various crystal orientations, they help in accurately understanding the relative orientations between crystal grains and the observed images in polycrystalline materials. This document presents a case where STEM images were simulated from the crystal orientation information obtained by the EBSD method for the crystal grains in a polycrystalline neodymium magnet, and compares them with actual high-resolution HAADF-STEM images.
basic information
Measurement methods: TEM, EBSD, computational science, data analysis Product fields: solar cells, secondary batteries, oxide semiconductors, power devices, optical devices, LSI, memory Analysis purpose: structural evaluation
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Analysis of solar cells, secondary batteries, oxide semiconductors, power devices, optical devices, LSI, and memory.