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[SEM-EDX] Energy Dispersive X-ray Spectroscopy (SEM)

It is a method for conducting elemental analysis and compositional analysis by detecting characteristic X-rays generated by electron beam irradiation and spectrally analyzing them by energy.

EDX is a method for performing elemental and compositional analysis by detecting characteristic X-rays generated by electron beam irradiation and spectrally analyzing them by energy. It is also referred to as EDS: Energy Dispersive X-ray Spectroscopy. In many cases, it is attached to SEM or TEM, and this document will explain EDX attached to SEM. - The entire energy measurement range (from B to U) can be measured simultaneously in a short time. - It has excellent detection efficiency, allowing measurements with a low probe current. - Analysis can be easily performed without the need for pretreatment, except for special samples. - It is suitable for the analysis of unknown samples. - Measurements can be conducted in a frozen or cooled state using a cryo holder.

Related Link - https://www.mst.or.jp/method/tabid/142/Default.asp…

basic information

EDX spectrally detects characteristic X-rays generated by electron beam irradiation based on their energy. The energy of specific X-rays is unique to each element, allowing for the identification of the elements that make up the sample. Additionally, information about the composition can be obtained from the intensity.

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Applications/Examples of results

- Composition analysis of foreign substances - Visualization of elemental distribution through surface analysis - Visualization of migration through surface analysis - Further semi-quantitative analysis from qualitative analysis - Identification of layered structures - Identification of components in abnormal layers and residues

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