[Analysis Case] Manufacturing Equipment and Components
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[Analysis Case] Manufacturing Equipment and Components
We will introduce examples of analysis for manufacturing equipment and components.
31~60 item / All 100 items
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Gas analysis using the heart-cut EGA method.
GC/MS: Gas Chromatography-Mass Spectrometry
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[Analysis Case] Composition Evaluation of Nozzle Surface and Inner Wall
It is possible to evaluate the compositional distribution of the convex and concave samples.
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Gas generation analysis by EGA-MS method
GC/MS: Gas Chromatography-Mass Spectrometry
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[Analysis Case] Evaluation of Cu Surface Discoloration Using AES and SEM-EDX
It is possible to perform elemental analysis with a shallow detection depth while conducting SEM observation.
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[Analysis Case] Fluorescent X-ray Analysis Case of Metal Materials
As a metal composition evaluation, we recommend starting with elemental screening using XRF analysis.
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Examples of TDS analysis by representative materials and purposes
TDS: Thermal Desorption Gas Analysis Method
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Evaluation of metal contamination on the Si wafer surface
ICP-MS: Inductively Coupled Plasma Mass Spectrometry
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[Analysis Case] Investigation of Watermark Causes
Identification of contamination sources on the outermost surface using TOF-SIMS.
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[Analysis Case] Analysis of Microscopic Contaminants on Wafer Surface
Composition analysis of 30nm size is possible without processing.
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[Analysis Case] Evaluation of the Fracture Surface of Laminated Samples by AES Analysis
Visualizing a 50nm thin film with a cross-sectional sample.
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Evaluation of organic contamination using a wafer analyzer with GC-MS.
GC/MS: Gas Chromatography-Mass Spectrometry
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[Analysis Case] Thermal Desorption Gas Analysis of Metal (Sn)
TDS analysis of low melting point metals
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[Analysis Case] Analysis of Metal Contamination in SiN Films
High-sensitivity analysis using ICP-MS.
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Molecular weight distribution measurement by GPC
HPLC: High-Performance Liquid Chromatography
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[Analysis Case] Raman Mapping of Carbon Materials
It is possible to evaluate the distribution of the crystalline state of carbon within the sample surface.
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[Analysis Case] Corrosive Gas Analysis by TDS
You can check for gases that have a negative impact on the product.
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[Analysis Case] Observation of Shape Changes of Polymers on a Substrate Using Liquid AFM Measurements
Visualization of structural changes in samples in the atmosphere and in aqueous solutions.
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Outgas analysis using a gas concentration device with GC/MS.
GC/MS: Gas Chromatography-Mass Spectrometry
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[Analysis Case] Foreign Substance Analysis on Metal Components by Raman
Measurement targeting microdomains is possible.
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[Analysis Case] Evaluation of Metal and Organic Contamination on Wafer Surface
Comprehensive evaluation based on the analysis results of multiple methods.
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[Analysis Case] Evaluation of Gold Thin Film Adhesion on Wafer by XRF
Comparison of the amount of thin film components adhered between samples.
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[Analysis Case] In-plane film thickness evaluation of Au thin film on wafer using XRF.
Visualization of film thickness distribution through multi-point mapping measurement.
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[Analysis Case] Depth Direction Analysis of XPS on the Micron (μm) Order
Depth direction analysis will be conducted to a depth of several micrometers.
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[Analysis Case] Analysis of Hydrogen Desorption from Stainless Steel by TDS
It is possible to evaluate the amount of hydrogen released from metals using TDS (Thermogravimetric Desorption Gas Analysis).
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Analysis case: Evaluation of the oxide film on the surface of solder balls.
Evaluation case of spherical shape samples
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Analysis case: Metal content analysis in a solution
High-sensitivity analysis of various solutions, such as pure water and wafer cleaning liquids, is possible.
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[Analysis Case] Tensile Test of Foam Rubber Using X-ray CT
Measurement and analysis of shape changes inside the sample in situ.
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[Analysis Case] TDS Analysis of Epoxy Resin
It is possible to investigate the degassing behavior of organic matter in a vacuum.
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[Analysis Case] Simultaneous Heating Analysis of Copper Plates and Solder by TDS
It is possible to evaluate degassing in an environment close to the actual process by bringing the materials into contact with each other.
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Angle-resolved HAXPES measurement
HAXPES: Hard X-ray Photoelectron Spectroscopy
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