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[Analysis Case] Visualization of Strain at Heterojunction Interfaces in Compounds

C0010.jpg
InGaP_GaAs多層膜の高分解能TEM像.png
FFTサイズの設定.png
FFTパターン.png

[Analysis Case] Visualization of Strain at Heterojunction Interfaces in Compounds

C0010.jpg
C0010.jpg InGaP_GaAs多層膜の高分解能TEM像.png FFTサイズの設定.png FFTパターン.png

Lattice image analysis using the FFTM method

The Fast Fourier Transform Mapping method is a technique that performs a Fourier transform on high-resolution TEM images to analyze and visualize the minute lattice distortions of crystals from the spot positions of the FFT pattern. Through FFTM analysis, it is possible to (1) analyze lattice distortions in the x and y directions of the image, (2) analyze lattice distortions in the crystal plane direction, (3) analyze the distribution of crystal plane spacing and crystal plane orientation, (4) display the data distribution as a histogram, and (5) detect distortions of 0.5% with a spatial resolution of 5 nm. An example of its application to compound heterojunction multilayer film samples is presented.

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Measurement Method: TEM Product Field: Lighting and Optical Devices Analysis Purpose: Structural Evaluation, Stress, Strain Evaluation

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[Analysis Case] Visualization of Strain at Heterojunction Interface of Compounds_C0010

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MST is a foundation that provides contract analysis services. We possess various analytical instruments such as TEM, SIMS, and XRD to meet your analysis needs. Our knowledgeable sales representatives will propose appropriate analysis plans. We are also available for consultations at your company, of course. We have obtained ISO 9001 and ISO 27001 certifications. Please feel free to consult us for product development, identifying causes of defects, and patent investigations! MST will guide you to solutions for your "troubles"!

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