[Analysis Case] Component Analysis of Organic EL Emission Layer
Possible to dismantle and preprocess while maintaining the atmosphere, up to the introduction of equipment.
It is known that organic EL materials undergo changes when exposed to air. We present results obtained from TOF-SIMS regarding the surface state of luminescent materials left in a nitrogen atmosphere and in the atmosphere. In samples produced in a nitrogen atmosphere, parent ions are primarily detected, but when left in air, fragments with oxygen attached to the parent ions are detected. For materials that are prone to degradation, it is necessary to analyze them without exposing them to the atmosphere.
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