一般財団法人材料科学技術振興財団 MST Official site

[Analysis Case] IGZO

Case studies of XRD and XRR analysis of oxide semiconductors.

The transparent oxide semiconductor IGZO thin film is being researched and developed as a TFT material for displays. IGZO is a material whose properties change significantly based on the composition of the film, the presence of oxygen vacancies, and crystallinity, making it important to consider the correlation with film quality. We will introduce a case where the crystallinity, film thickness, and film density of three types of IGZO thin films with different heating temperatures were measured and compared using XRD and XRR. It was confirmed non-destructively that crystallization progresses at high temperatures, resulting in higher film density.

Related Link - https://www.mst.or.jp/casestudy/tabid/1318/pdid/10…

basic information

For detailed data, please refer to the catalog.

Price range

Delivery Time

Applications/Examples of results

Analysis of display, oxide semiconductors, LSI, and memory.

[Analysis Case] IGZO Thin Film Crystallinity and Film Density Evaluation_C0283

PRODUCT

Distributors

Recommended products