[Analysis Case] Evaluation of "Water" in Si Oxide Films and ITO Films using SIMS
Depth-direction analysis of hydrogen using 'heavy water (D2O) treatment'
We will introduce a case where the permeability of water (H2O) in a thin film with a thickness of less than 1 µm was evaluated by measuring the distribution of deuterium (D) in the film. When hydrogen (H) is originally present in the thin film, it is difficult to distinguish whether the hydrogen is due to the influence of water. Therefore, treatment with heavy water (D2O) was performed, and the distribution of the naturally occurring isotope deuterium was measured in the depth direction using SIMS. By examining the depth distribution of deuterium, it is possible to estimate how deep the water has penetrated.
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Applications/Examples of results
Trace concentration evaluation, degradation investigation, reliability assessment.