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[Analysis Case] Identification and Estimation of Foreign Substances and Contaminants in LCD Panels

C0081.jpg

[Analysis Case] Identification and Estimation of Foreign Substances and Contaminants in LCD Panels

C0081.jpg
C0081.jpg

We capture foreign substances and dirt from microns to centimeter order as an image.

In the mass production of LCD panels, it is necessary to remove defects (foreign substances and dirt). Therefore, investigating the causes of these foreign substances and dirt is effective for improving yield. Here, we introduce a case study evaluating foreign substances and dirt on LCD panels. TOF-SIMS can capture cleaning residues in the order of micrometers to centimeters as images. Additionally, by comparing with standard spectra, it is possible to estimate the components.

Related Link - https://www.mst.or.jp/casestudy/tabid/1318/pdid/13…

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[Analysis Case] Identification and Estimation of Foreign Substances and Contaminants in LCD Panels_C0081

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MST is a foundation that provides contract analysis services. We possess various analytical instruments such as TEM, SIMS, and XRD to meet your analysis needs. Our knowledgeable sales representatives will propose appropriate analysis plans. We are also available for consultations at your company, of course. We have obtained ISO 9001 and ISO 27001 certifications. Please feel free to consult us for product development, identifying causes of defects, and patent investigations! MST will guide you to solutions for your "troubles"!

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