[Analysis Case] Identification and Estimation of Foreign Substances and Contaminants in LCD Panels
We capture foreign substances and dirt from microns to centimeter order as an image.
In the mass production of LCD panels, it is necessary to remove defects (foreign substances and dirt). Therefore, investigating the causes of these foreign substances and dirt is effective for improving yield. Here, we introduce a case study evaluating foreign substances and dirt on LCD panels. TOF-SIMS can capture cleaning residues in the order of micrometers to centimeters as images. Additionally, by comparing with standard spectra, it is possible to estimate the components.
basic information
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Applications/Examples of results
This is an analysis of the display.