Distortion evaluation using SEM equipment
EBSD: Electron Backscatter Diffraction
Measurements can be performed in bulk state without the need for thinning processes like TEM (NBD: Nano Beam Diffraction). It has the high spatial resolution characteristic of SEM and relatively high strain sensitivity. Additionally, there is a possibility of detecting local lattice strain as tensor data.
basic information
For detailed data, please refer to the catalog.
Price information
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Delivery Time
Applications/Examples of results
Crystal structure evaluation, stress, and strain assessment.