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Distortion evaluation using SEM equipment

EBSD: Electron Backscatter Diffraction

Measurements can be performed in bulk state without the need for thinning processes like TEM (NBD: Nano Beam Diffraction). It has the high spatial resolution characteristic of SEM and relatively high strain sensitivity. Additionally, there is a possibility of detecting local lattice strain as tensor data.

Related Link - https://www.mst.or.jp/casestudy/tabid/1318/pdid/38…

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For detailed data, please refer to the catalog.

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Applications/Examples of results

Crystal structure evaluation, stress, and strain assessment.

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Distortion Evaluation with SEM Equipment_B0098

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Notice of publication of a written article in the May 2012 issue of Applied Physics.
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In the May 2012 issue of the monthly magazine "Applied Physics," published by the Japan Society of Applied Physics, the MST General Foundation for Materials Science and Technology contributed an article on scanning electron microscopy (SEM). ● Magazine Overview - Publisher: Japan Society of Applied Physics - Published Issue: May 2012, Applied Physics - Project Name: Basic Course <Hop, Step, Jump> Series "Scanning Electron Microscopy" ● MST Contribution Overview - Author: Kyoko Yonemitsu, Leader of the Analysis and Evaluation Department, MST General Foundation for Materials Science and Technology - Content: Applications of scanning electron microscopy in research and development - Case studies and uses Please take a look.

May 11, 2012

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MST is a foundation that provides contract analysis services. We possess various analytical instruments such as TEM, SIMS, and XRD to meet your analysis needs. Our knowledgeable sales representatives will propose appropriate analysis plans. We are also available for consultations at your company, of course. We have obtained ISO 9001 and ISO 27001 certifications. Please feel free to consult us for product development, identifying causes of defects, and patent investigations! MST will guide you to solutions for your "troubles"!

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