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[Analysis Case] Evaluation of pn Junction and Grain Structure of CIGS Film

C0129.jpg
SEM.png
EBIC.png

[Analysis Case] Evaluation of pn Junction and Grain Structure of CIGS Film

C0129.jpg
C0129.jpg SEM.png EBIC.png

Electron beam induced current method and crystal orientation analysis using SEM.

CIGS thin-film polycrystalline solar cells are expected to be low-cost next-generation solar cells. Development is underway for large-area and high-quality production. To evaluate the characteristics of the polycrystalline thin film, we conducted assessments of the pn junction using EBIC and crystal grain evaluation using EBSD on the same cross-section. We prepared a cross-section of the CIGS film and measured the open-circuit voltage (EBIC) by scanning an electron beam, visualizing the in-plane distribution of the open-circuit voltage. Additionally, by measuring EBSD on the same surface, we correlated the distribution of the open-circuit voltage with the crystal grains.

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Analysis of solar cells.

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[Analysis Case] Evaluation of pn Junction and Grain Structure of CIGS Film_C0129

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