[Analysis Case] Qualitative Analysis of Epoxy Resin

Estimation of components is possible through TOF-SIMS analysis.

last updated Apr 02, 2026

Analysis case: Composition distribution analysis of CIGS thin films

It is possible to evaluate the composition quantification, in-plane distribution, and depth distribution of thin films.

last updated Apr 02, 2026

[Analysis Case] Composition and Impurity Analysis of CIGS Powder

Quantitative analysis of main components and trace components is possible.

last updated Apr 02, 2026

[Analysis Case] SCM Analysis of SiC Planer Power MOS

You can visualize the diffusion layer structure of SiC devices.

last updated Apr 02, 2026

[Analysis Case] Photoluminescence Analysis of White LEDs

Verification of the luminous characteristics of the chip and phosphor in white LEDs.

last updated Apr 02, 2026

[Analysis Case] Evaluation of Surface Metal Contamination in Plastic Containers

Evaluation of the composition and distribution of impurities in polymer materials using XRF.

last updated Apr 02, 2026

[Analysis Case] Evaluation of Cleansing Oil's Cleaning Effectiveness

Measurement examples of cleaning residues using TOF-SIMS.

last updated Apr 02, 2026

[Analysis Case] Depth Profile Analysis of Dopant Elements in SiC Using SIMS

It is possible to evaluate the depth distribution of B, Al, N, P, and As in SiC with high sensitivity.

last updated Apr 02, 2026

[Analysis Case] Evaluation of SiC Power MOSFET Dopants by SIMS

Imaging SIMS enables the evaluation of localized elements.

last updated Apr 02, 2026

[Analysis Case] SiC by SIMS

Imaging SIMS allows for the evaluation of localized elements.

last updated Apr 02, 2026

[Analysis Case] Layered Structure Analysis of Heat-Resistant PET Bottles for Food Use

It is possible to identify the components of each layer of PET bottles using TOF-SIMS.

last updated Apr 02, 2026

[Analysis Case] Composition Analysis of Sheet-Like Active Material for Lithium-Ion Secondary Batteries

Quantitative analysis of the main components of sheet-like active substances is possible.

last updated Apr 02, 2026

[Analysis Case] Evaluation of Si Anode in Lithium-Ion Secondary Batteries

It is possible to evaluate the structure of the Si anode after charging through sample cooling.

last updated Apr 02, 2026

[Analysis Case] Evaluation of Lithium-Ion Secondary Battery Separators

Cool the sample and evaluate the shape of the separator more accurately.

last updated Apr 02, 2026

[Analysis Case] Evaluation of Electrode Materials for Lithium-Ion Secondary Batteries

Cross-sectional observation using atmosphere-controlled ion polishing (IP) processing is possible.

last updated Apr 02, 2026

[Analysis Case] Evaluation of Silicon (Si) Oxide Film State

It is possible to capture molecular information of inorganic substances in the depth direction using TOF-SIMS.

last updated Apr 02, 2026

[Analysis Case] Distribution and State Evaluation of OH on Aluminum (Al) Surface

It is possible to capture molecular information of inorganic substances in the depth direction using TOF-SIMS.

last updated Apr 02, 2026

[Analysis Case] Evaluation of SUS Passive Film Depth Direction State and Oxide Film Thickness

It is possible to capture molecular information of inorganic substances in the depth direction using TOF-SIMS.

last updated Apr 02, 2026

[Analysis Case] Photoluminescence Mapping Measurement of SiC Diodes

Detection cases of stacking faults in SiC.

last updated Apr 02, 2026

[Analysis Case] Evaluation of Impurities in Metal Wires

Visualizing the in-plane distribution of impurities such as atmospheric components with a field equivalent to SEM.

last updated Apr 02, 2026

[Analysis Case] Evaluation of Si Natural Oxidation Film Thickness

Estimation of film thickness using the average free path of photoelectrons.

last updated Apr 02, 2026

[Analysis Case] SIMS Measurement of Specially Shaped Samples

Analysis is possible even for special shapes through innovative fixing methods.

last updated Apr 02, 2026

[Analysis Case] Diffusion Evaluation of Ga and Al in Si Substrate using SSDP-SIMS

Measurement avoiding the influence of high concentration layers using SSDP-SIMS.

last updated Apr 02, 2026

[Analysis Case] Evaluation of Element Distribution in Textured GaN-based LEDs

Even with a structure that has uneven surfaces, depth distribution evaluation is possible through flattening processing.

last updated Apr 02, 2026

[Analysis Case] Depth Profile Concentration Analysis of Impurities in GaN-based LEDs Using SIMS

Measurements will be taken under analysis conditions suited to the purpose.

last updated Apr 02, 2026

[Analysis Case] Dopant Investigation in NPT-IGBT Using SIMS

Evaluation of localized elements is possible with imaging SIMS.

last updated Apr 02, 2026

[Analysis Case] Quality Evaluation of SiC Substrates

Evaluation of crystal orientation, in-plane defect distribution, surface roughness, and impurities.

last updated Apr 02, 2026

[Analysis Case] Evaluation of Carrier Density Distribution in Power Devices

Evaluation of the activation rate of the Dopant is possible.

last updated Apr 02, 2026

[Analysis Case] Evaluation of Dopant and Carrier Concentration Distribution in Power Devices

Evaluation of activation rate is possible through composite analysis.

last updated Apr 02, 2026

[Analysis Case] SIMS Analysis of Compound Layered Structure Samples

Analysis is possible after selectively removing the compound layer through preprocessing.

last updated Apr 02, 2026