[Measurement Method] Electron Microscopy Observation and Analysis
![[Measurement Method] Electron Microscopy Observation and Analysis](https://image.mono.ipros.com/public/premium/image_category/099/387108/IPROS3455379713280402900.jpg?w=140&h=140)
[Measurement Method] Electron Microscopy Observation and Analysis
◆AES (Auger Electron Spectroscopy) ◆SEM (Scanning Electron Microscopy) ◆EBIC (Electron Beam Induced Current) ◆EBSD (Electron Backscatter Diffraction) ◆EDX (Energy Dispersive X-ray Spectroscopy) ◆EPMA (Electron Probe Microanalysis) ◆TEM (Transmission Electron Microscopy) ◆EELS (Electron Energy Loss Spectroscopy) ◆SIM (Scanning Ion Microscopy)
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Custom analysis tailored to support research and development environments.
We will provide high-value-added analysis services by integrating AI with cutting-edge analytical technologies.
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[Analysis Case] Observation of Multi-Scale Structure of Blade-Type Battery
We observed the internal structure of LFP batteries using X-ray CT and SEM.
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